NEX OL

    Process Energy Dispersive X‑ray Fluorescence Analyzer

    Real-time, on-line process elemental analysis

    Featuring advanced third-generation energy dispersive X-ray fluorescence (EDXRF) technology, the Rigaku NEX OL represents the next evolution of process elemental analysis for liquid stream and fixed position web or coil applications. Designed to span from heavy industrial through to food grade process gauging solutions, the NEX OL is configurable for use in both classified and non-classified areas.

    NEX OL Overview

    Analyze from aluminum (₁₃Al) to uranium (₉₂U)

    To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX QC+ high resolution benchtop instrument. With this proven technology, the Rigaku NEX OL delivers rapid, non-destructive, multi-element analyses – from parts-per-million (ppm) levels to high weight percent (wt%) concentrations – for elements from aluminum through uranium. Equipped with a 50 kV X-ray tube and SDD detector – together with a standardized, optimized suite of tube filters – the Rigaku NEX OL is engineered to solve a broad range of process control applications.

    Unique tool-less flow cell design

    For the elemental analysis of liquid streams, an analyzing head is mated to a unique tool-less flow cell assembly incorporating the X-ray window. The X-ray window contains the liquid stream but is transparent to X-rays; it is typically a plastic film.

    Coating thickness and composition

    In addition to analyzing liquid streams, the Rigaku NEX OL is designed to service web and coil applications, with the ability to perform multi-element composition and/or coating thickness. Typically a head is mounted in a fixed position over a roller so that the head to surface distance is constant.

    NEX OL Features

    Real-time process control by elemental analysis
    Measure elements aluminum (₁₃Al) to uranium (₉₂U)
    From ppm levels to weight percent (wt%) concentrations
    Robust Rigaku NEX QC+ optical kernel with SDD detector
    Industrial touch screen user interface
    Easy empirical calibration and routine operation
    Routine maintenance typically requires no tools
    Multiple remote analysis heads for non-classified areas
    No dangerous radioisotopes

    NEX OL Specifications

    Technique Energy dispersive X-ray fluorescence (EDXRF)
    Benefit Real time, on-line elemental analysis of Al through U
    Technology Process EDXRF
    Core attributes 50 kV, 4 W X-ray tube, SDD detector, tool-less flow cell design (liquids), fixed head for coating thickness and composition
    Computer Internal PC, embedded Linux OS, NEX OL software
    Power requirements 1Ø, 110/240 VAC, 2.5/1.5 A, 47-63 Hz

    NEX OL Application Notes

    The following application notes are relevant to this product

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