Notes
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Classes will be limited to six (6) students, so first to
sign up get priority
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Costs are only applicable to those who did not
purchase their training as a part of a quote
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Costs shown above do not include travel and lodging,
but do include lunch
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All prices are listed in US dollars
To request a training session at a time other than one of those
listed above, please contact
our XRD department with a list of preferred dates.
Individualized personal XRD training at Rigaku's The Woodlands
site can be requested at $1500/day for exclusive instruction and
applications purposes.
Customer site XRD training option available for instrument
specific custom designed course at $1800/day, plus expenses. XRD expert
trainers to come to you!
Please contact Diana Sandefur
at (281) 362-2300 ext. 240 to schedule training today!
What are our students saying about our XRD training sessions?
"Everyone is very helpful and goes out of their way to
help"
"The training courses made everything very clear"
"Got me excited about incorporating XRD into my
research"
"Instructors are very flexible in adjusting presentations
to our interests"
"I'm excited to get home and try new things"
"They are very interested in making the instrument meet
my needs"
XRD training course descriptions
Software training
DAY ONE (Daily class times: 9:00 a.m. to 6:00 p.m.)
1) Basic Analysis
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Opening X-ray raw data patterns
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Opening saved data analysis for group pattern processing
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Importing and exporting of data into non-Rigaku formats for data
sharing
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Visual architecture—explanation of screen layouts, tool bars, buttons and
display controls
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Data smoothing, filters, changing step size, trimming data
range
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Applying a background
2) Search /Match
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Iterative searching styles
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Supplemental tools for searches
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Accepting defaults versus advanced features (for solid solution and highly
oriented samples)
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Data mining using the PDF reference library
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Building sub files for frequently used references
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Quality markers and references
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Tools for confirmation of phases
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Including kβ templates
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Simulations
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Residual indicators
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Figure of Merit
3) Statistical Pattern Information Output
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Two theta positions
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d-spacing and relative intensities
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Creating new reference patterns in the database from experimental
data or published data
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Printing and report capabilities
DAY TWO
1) Profile fitting
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Defining the area of the pattern and peaks
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Defaults and integrations
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Peak shapes and when to constrain variables
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Crystallite size analysis
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Percent crystallinity
2) Easy Quant using RIR method
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Coupled with Search/Match and profile
fitting to determine semi-quantitative weight percents
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Internal standards
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External standards and calibration plots
3) Overview of Rietveld Refinement
Four example patterns for Rietveld quantitative analysis
are calculated as an introduction.
DAY THREE (Optional Day)
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Overview of Rietveld Basic
Operations
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Loading phases (atomic structure phases or structure-less
phases ):
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Global parameters for refinement
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Phase parameters for
refinement
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Refinement controls: global and phase
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Displays and
results, including report output formats for various publications
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Practical Examples:
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Specific Topics also covered
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Background Model Parameters-polynomial
versus user defined backgrounds
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Interpretations of statistical and
graphical displays of refinements
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Refinement operation using
structure-less phases
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Automatic atomic coordinates linking (cif, csf)
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Internal standard calibrations for 2θ reference
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Easy
instrument properties modification- sample displacement shift theta compensating
slits, thin film absorption, cylindrical specimen, etc.
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Solid solution
substitutions and site occupancy refinements
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Rotating 3-D structure
viewing and stereo projections
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Interactive links to Search/Match for
residual unmatched area
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Constraints on Variables
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Multiple data regions can be excluded
(i.e. Sample holder or substrate reflections)
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Preferred orientations
corrections
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Individual FWHM profile shape fitting for turbostatic
effects.
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Lattice/crystal structure parameters
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Selective use of
phases in refinement (phases included or excluded from refinements)
DAY ONE
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Reference materials will be handed out ("Where do I find...")
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X-ray safety
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MiniFlex hardware component identification
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Changing X-ray tubes and aligning
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Proper tube selection and impact on the diffraction plot
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System maintenance
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Perform system checks
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Keep system logs
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Routine maintenance items
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Sample preparation
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Sources of error
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Various methods for "unusual" sample types-expanding your
horizons through sample prep!
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Data collection (strategies and techniques)
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Proper selection of collection parameters
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Fast vs. slow scans
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Improving your statistics
DAY TWO
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Opening raw data files
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Overlaying multiple patterns and manipulating multiple files for trend
information
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Adding or subtracting overlays,
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Merging segments, etc
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Accessing data; storing and printing processed data
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Processing: Background/Kα2 subtraction; Smoothing
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Search/Match: Identifying phases, tools and techniques to aid your
search
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Building your own database of commonly used materials
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Profile Fitting techniques/ crystallite size/ % crystallinity (if
appropriate)
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Preview of Quantitation modules Either/ or:
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Easy Quant using RIR relative intensity ratio method
Easy quant using calibration curves
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Whole Pattern Fitting/ Rietveld analysis—quantitation
Customer site software and instrument training course:
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Convenience of your own site for training
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Custom designed to accommodate your instrument
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Custom designed to cater to your staff
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From two to five days of individual attention from expert
trainers