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Cement

Cement Industry

Analyze raw materials to finished cement

Modern Portland cement is made by mixing substances containing lime, silica, alumina, and iron oxide and then heating the mixture until it almost fuses. During the heating process dicalcium and tricalcium silicate, tricalcium aluminate, and a solid solution containing iron are formed. X-ray fluorescence (XRF), a standard technique across the cement industry, is used to determine metal-oxide concentrations and oxide stoichiometry. X-ray diffraction (XRD) provides quantitative analysis of free lime in clinker, which is critical to the production process. Kiln parameters are monitored, and adjusted continuously, based on XRD and XRF analytical results. Rigaku technology and know-how provide a number of unique solutions for these measurements.

Application Notes

The following application notes are relevant to this industry

XRD

EDXRF

WDXRF

WDXRF, XRF

Rigaku recommends the following systems:


WDXRF

Sequentielles WDRFA Spektrometer zur Analyse der Elemente von O bis U in Feststoffen, Flüssigkeiten und Pulvern

Sequenzielles WDRFA-Spektrometer mit hoher Leistung, Röhre oberhalb der Probe, mit ZSX Guidance Systemsoftware

High-throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

XRD

New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

High-performance, multi-purpose XRD system for applications ranging from R&D to quality control

EDXRF

Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

EDXRF spectrometer with powerful Windows® software and optional FP.

High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

X-ray CT

High-speed, stationary sample microtomography of large samples

High-resolution benchtop microtomography of large samples