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Rigaku Journal
The Rigaku Journal is a semiannual journal published by the Rigaku Corporation to serve the X-ray analysis com­munity in general, and to serve Rigaku instru­men­tation users in particular. The Rigaku Journal is a scientific and technical journal, publishing articles relating to a wide range of X-ray diffraction and fluorescence applications.
 
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Rigaku Journal: An International Journal of X-ray Characterization

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Submit manuscripts (3 copies) to the Editor-in-Chief. There is no publication charge. See The Rigaku Journal Notes for Authors, which is available on request to the Editor-in-Chief, for additional information.

Address changes, proofs, reprints and all correspondence concerning papers in the process of publication should be addressed to the Editor-in-Chief.

Permission for other use: Permission is granted to quote from the journal with the customary acknowledgment of the source. To reprint a figure, table, or other requires the consent of the author and notification to Editor-in-Chief.

ISSN 0913-543X; CODEN: RIJOFV

Editor-in-Chief
Hideo Toraya
Rigaku Corp. 3-9-12 Matsubara-cho,
Akishima-shi, Tokyo, 196-8666 Japan
Associate Editor-in-Chief
Ting C. Huang
6584 Radko Drive, San Jose,
CA 95119-1924, USA
Editor for Crystal Structures
Joe Ferrara
Rigaku Americas Corporation,
9009 New Trails Dr.,
The Woodlands, TX 77381-5209, USA
Editor for Powder Diffraction and Thin Films
Thomas N. Blanton
Eastman Kodak Co.,
Kodak Research Laboratories,
Building 82, Room 536
Rochester, NY 14650-2106, USA
Editor for X-ray Fluorescence
Michael K. Mantler
Rigaku Americas Corporation,
9009 New Trails Dr.,
The Woodlands, TX 77381-5209, USA
Managing Editor
Kenichi Yaoita
Rigaku Corp., 3-9-12 Matsubara-cho,
Akishima-shi, Tokyo, 196-8666 Japan
email: yaoita@rigaku.co.jp