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Rigaku Journal

The Rigaku Journal is a semiannual journal published by the Rigaku Corporation to serve the X-ray analysis community in general, and to serve Rigaku instrumentation users in particular. The Rigaku Journal is a scientific and technical journal, publishing articles relating to a wide range of X-ray diffraction and fluorescence applications.

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The Rigaku Journal Volume 12 No. 1/November 1995

Preface	P. K. Predecki	43529
Contributed Papers
Zeolite Structure Analysis with Powder X-ray Diffraction and Solid-State NMR Techniques	G. T. Kokotailo and C. A. Fyfe	764554
On the Use of Energy Dispersive X-ray Reflection to Study the Electronic Density Profile at Surfaces and Interfaces	R. Felici	245890
If Your Only Single Crystal is Not Really Single	L. W. Finger	299890
The 6 m Point-Focusing Small-Angle X-ray Scattering Camera at the High-Intensity X-ray Laboratory in Kyoto University and the Application to Polymer Science	S. Suehiro, H. Miyaji, Y. Miyamoto and T. Yoshizaki	1901939
Technical Note
Measurement of Thin Films on Single Crystal Substrates by the 2θ/α Scanning Methods	M. Nakayama	706387
Product Information
Grazing Incidence X-ray Reflectometer GXR²		515981
On-Line Multichannel Simultaneous X-ray Spectrometer System Simultix 10S, Simultix 11S		1357307
Time Saver Mercury Analysis System RA-Mercury Analyzer with Sample-Changer		60538
Topics
The 100 Year Discovery of X-rays and W. C. Röntgen's 150 Birthday		402166

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