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The Rigaku Journal is a semiannual journal published by the Rigaku Corporation to serve the X-ray analysis com­munity in general, and to serve Rigaku instru­men­tation users in particular. The Rigaku Journal is a scientific and technical journal, publishing articles relating to a wide range of X-ray diffraction and fluorescence applications.
 
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The Rigaku Journal Volume 12 No. 2/November 1995

Contents Author Bytes
Preface
100 Years of X-rays Ulrich Hennig 108656
To W.C. Röntgen 100 years later Jenny P. Glusker 154017
Contributed papers
Microdiffraction Used to Study Domain Switching of Ferroelectric Thin Films Michael O. Eatough, Mark A. Rodriquez, Duane Dimos and Bruce Tuttle 225775
Crystal Structure of Zeolite Y as a Function of Ion Exchange J. A. Kaduk and J. Faber 3055491
Utilization of the R-AXIS Area Detector in Routine Small Molecule X-ray Structure Determinations P. J. Carroll 149297
High Power X-ray Generator for XAFS Experiments K. Sakurai and H. Sakurai 610457
Product Information
High-Speed X-ray Diffractometer R-AXIS IV 282774
Rigaku/MiniFlex+ X-ray Diffractometer System 436045
Total Reflection X-ray Spectrometer SYS 3700LE—Designed for Light Element Analysis 1623932

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