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The Rigaku Journal is a semiannual journal published by the Rigaku Corporation to serve the X-ray analysis com­munity in general, and to serve Rigaku instru­men­tation users in particular. The Rigaku Journal is a scientific and technical journal, publishing articles relating to a wide range of X-ray diffraction and fluorescence applications.
 
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The Rigaku Journal Volume 13 No. 1/May 1996

Contents Author Bytes
Preface
Large synchrotron facilities in basic and applied research Nicholas P. Samios 143853
Contributed papers
X-ray Diffraction Characterization of Multilayer Epitaxial Thin Films Deposited on (0001) Sapphire Thomas N. Blanton and Liang-Sun Hung 226058
Structural Aspects of Divergent Proton Translocation Trajectories in Carbonic Anhydrases II and V David W. Christianson 793845
In Situ X-ray Absorption Study of Copper Surface Complexes: Microbial Influenced Oxidation of Metallic Copper Henrich H. Paradies, Michael Thies and Ulrike Hinze 517492
X-ray Fluorescence Analysis of Heavy Atoms By Use of Ultrashort Wavelength X-ray Yasuhiko Takahashi 998138
Technical Note
An Introduction to X-ray Absorption Fine Structure (Part II) Yasuo Udagawa 879483
Product Information
Ultra-high Power X-ray Generator SUPRE-X1.5A 431432
High Sensitivity Total Reflection X-ray Spectrometer TXRF System 3750 597044

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