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Rigaku Journal

The Rigaku Journal is a semiannual journal published by the Rigaku Corporation to serve the X-ray analysis community in general, and to serve Rigaku instrumentation users in particular. The Rigaku Journal is a scientific and technical journal, publishing articles relating to a wide range of X-ray diffraction and fluorescence applications.

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The Rigaku Journal Volume 15 No. 2/November 1998

Contents	Author	Bytes
Preface
A Look at the Future of Macromolecular Structure Determination	Duilio Cascio, Kenneth Goodwill and Edward Marcotte	523863
Contributed papers
Macromolecular Crystal Annealing: Techniques and Case Studies	Gerard Bunick, Joel Harp, David Timm and Leif Hanson	1488804
The Fundamental Algorithm: An Exhaustive Study of the Claisse-Quintin Algoritm and the Tertian and Lachance Identities Part II: Application	R.M. Rousseau	126178
High Pressure Apparatus for In Situ X-ray Diffraction and Electrial Resistance Measurement at Low Temperature	Takehiko Matsumoto, Jie Tang and Nobuo Mori	1049891
X-ray Absorption Spectroscopy Using X-ray Fluorescence Spectrometer	Jun Kawai, Kouichi Hayashi, Kazuaki Okuda and Atsushi Nisawa	615740
Amorphous Silicon (a-Si)/Crystalline Silicon (c-Si) Double HeteroJunction X-ray Sensor	Wei Guang-Pu, Wu Wen-Bion, Pei Guang-Wen, T. Kita, H. Nakayama, T. Nishino, W. Ma, H. Okamoto, M. Okuyama and Y. Hamakawa	253581
Product Information
X-ray Single Crystal Structure Analysis System R-AXIS RAPID		1877526

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