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Rigaku Journal

The Rigaku Journal is a semiannual journal published by the Rigaku Corporation to serve the X-ray analysis community in general, and to serve Rigaku instrumentation users in particular. The Rigaku Journal is a scientific and technical journal, publishing articles relating to a wide range of X-ray diffraction and fluorescence applications.

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The Rigaku Journal Volume 18 No. 1/May 2001

Contents	Author	Bytes
Preface
Functional Algebra-an Important Bridge between Diffraction Experiments and their Evaluation	H. Bradaczek and G. Hildebrandt	247114
At the Beginning of the 21st-Century	J. Harada	95117
Contributed papers
Concept of the Influence Coefficient	R. M. Rousseau	329112
Application of the Imaging Plate Methodology to the Solution of Commensurate Modulated Structures: Identification of Long-Period Mica Polytypes by X-ray Diffraction	M. Nespolo	406866
Intensity Ratio of Transition-Metal Lα and Lβ Lines	J. Kawai	64153
A Convergent Beam, Parallel Detection X-ray Diffraction System for Characterizing Combinatorial Epitaxial Thin Films	K. Omote, T. Kikuchi, J. Harada, M. Kawasaki, A. Ohtomo, M. Ohtani, T. Ohnishi, D. Komiyama and H. Koinuma	71175
Study of a Structural Phase Transition in Gd₅(Si_1-xGe_x)₄ by Means of Temperature Dependent X-ray Powder Diffraction	Q. L. Liu, G. H. Rao, and J. K. Liang	135359
Product Information
Desktop X-ray Fluorescence Spectrometer ZSXmini—High-precision analysis with a wavelength dispersive type analyzer		816698

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