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The Rigaku Journal is a semiannual journal published by the Rigaku Corporation to serve the X-ray analysis com­munity in general, and to serve Rigaku instru­men­tation users in particular. The Rigaku Journal is a scientific and technical journal, publishing articles relating to a wide range of X-ray diffraction and fluorescence applications.
 
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The Rigaku Journal Volume 23 No. 1/May 2006

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Contents Author Size (bytes)
Annual Issue Of The Rigaku Journal, and Congratulation To Dr. Victor Buhrke Editorial 71223
High Throughput De Novo Structure Determination on a Home Source Using Quick Soaks, Actor and Parameter Space Screening John P. Rose, Zhi-Jie Liu, Lirong Chen, Doowon Lee, Wolfram Tempel, M. Gary Newton and Bi-Cheng Wang 6158070
Advances in Data Analysis of in situ X-Ray Powder Diffraction Data: A Case Study of Rubidium Oxalate (Rb2C2O4) R. E. Dinnebier, B. Hinrichsen, P. Rajiv and M. Jansen 4025765
Considerations Regarding the Alignment of Diffractometers for Residual Stress Analysis Thomas R. Watkins, O. Burl Cavin, Camden R. Hubbard, Beth Matlock, and Roger D. England 3022754
Considerations Regarding the Alignment of Diffractometers for Residual Stress Analysis: Appendix A. Description of Goniometers and Aspects of Data Collection Thomas R. Watkins, O. Burl Cavin, Camden R. Hubbard, Beth Matlock, and Roger D. England 3254398
3D Micro X-Ray Fluorescence Analysis Wolfgang Malzer 601834
Application Notes
SCXmini™: Benchtop Small Molecule Single Crystal X-ray Diffraction System 2247131
SmartLab® Automatic X-Ray Diffractometer 1202798

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