The Rigaku Journal Volume 6 No. 1/May 1989
| Preface | Raymond Jeanloz | 196739 |
| Contributed Papers | ||
| Analysis of Rocks Using X-ray Fluorescence Spectrometry | Timothy E. La Tour | 976141 |
| RIETAN A Software Package for the RIETVELD Analysis and Simulation of X-ray and Neutron Diffraction Patterns | F. Izumi | 1827516 |
| An Introduction to In-house EXAFS Facilities | Y. Udagawa | 1889859 |
| Residual stress Distribution in the Surface near the Joining Boundary of β-Si 3N4 and Carbon Steel | S. Tanaka and K. Oguiso | 1656741 |
| Technical Note | ||
| Standardless X-ray Fluorescence Spectrometry (Fundamental Parameter Method Using Sensitivity Library) | Y. Kataoka | 679308 |
| Product Information | ||
| X-Y Stage with a Mapping Function, and Curved PSPC Micro-area X-ray Diffractometer with a Total Reflection Capillary Collimator | 1261076 | |
| TEXSAN™ Structure Solution Package | 216993 | |
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