The Rigaku Journal Volume 7 No. 1/May 1990
| Preface | Gerald R. Lachance | 377276 |
| Contributed Papers | ||
| Minimizing the Sources of Error in the Analysis of Geological Samples by X-ray Fluorescence | N. W. Bower, P. E. Neifert, C. M. Lewis, and G. Luedemann | 60573 |
| Fluid, Hexatic, and Crystal Phases in Terephthal-bis-(4n)-Alkylanilines | D. Y. Noh, J. D. Brock, J. D. Litster, R. J. Birgeneau, and J. W. Goodby | 589282 |
| Thermophysical Properties of Boron Phosphide Single Crystalline Wafers | Y. Kumashiro | 287863 |
| Technical Note | ||
| Single Crystal Orientation Measurement by X-ray Methods | T. Kikuchi | 1852608 |
| Product Information | ||
| Scanning Type Double Crystal Topographic Goniometer Model 2 | 871248 | |
| On-Line Measurement & Analysis System | 3027293 | |
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