Rigaku Journal (ISSN 2187-9974)

Winter 2014, Volume 30, No. 1

  • Special Feature: GaN for Opto- and Power-electronic Applications (1) General features of GaN-related materials by Katsuhiko Inaba
  • Special Feature: GaN for Opto- and Power-electronic Applications (2) Characterization of GaN-related materials using high-resolution XRD by Katsuhiko Inaba
  • Visualization and analysis of pharmaceutical solids by X-ray microscopy by Yoshihiro Takeda and Kensaku Hamada
  • Introduction to single crystal X-ray analysis V. Some Key Points of structure analysis by Rigaku's CrystalStructure by Akihito Yamano and Mikio Yamasaki
  • Sample preparation for X-ray fluorescence analysis I. Outline of sample preparation by Yasujiro Yamada
  • High-throughput, high-resolution X-ray topography imaging system: XRT micron
  • WDXRF ultra low sulfur analyzer: Micro-Z ULS
  • High-speed 1D silicon strip X-ray detector: D/teX Ultra 250
  • Plate adapter for in situ X-ray diffraction experiments: PlateMate
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Summer 2013, Volume 29, No. 2

  • Rigaku's analytical instruments for R&D and production of pharmaceutical materials by Yukiko Namatame and Yukihiro Hara
  • Drug discovery by single crystal X-ray structure analysis by Akihito Yamano
  • Evaluation of polymorphic forms by powder X-ray diffraction and thermal analysis methods by Yukiko Namatame and Hiroaki Sato
  • Pharmaceutical raw material inspection with handheld Raman spectrometer by Taro Nogami and Fumihito Muta
  • Analysis of trace impurities in pharmaceutical products using polarized EDXRF spectrometer NEX CG by Takao Moriyama
  • Introduction to single crystal X-ray analysisis IV. Data collection and processing by Akihito Yamano and Mikio Yamasaki
  • Small molecule system based on hybrid pixel array technology: XtaLAB P200
  • Micro area X-ray stress measurement system: AutoMATE II
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Summer 2012, Volume 28, No. 2

  • Introduction to single crystal X-ray analysis II: Mounting crystals by Akihito Yamano
  • Multi-purpose X-ray diffractometer equipped with Kα₁ optical system and ab initio powder crystal structure analysis by Akimitsu Nedu
  • Size-strain analysis using the fundamental parameter (FP) method by Akihiro Himeda
  • XRF analysis by the fusion method for oxide powder on a benchtop WDXRF spectrometer Supermini by Yasujiro Yamada
  • Benchtop X-ray diffractometer | MiniFlex300 | MiniFlex600
  • Small angle X-ray scattering Kratky camera system BioSAXS-1000
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Winter 2012, Volume 28, No. 1

  • Characterization in lithium ion battery by Hikari Takahara
  • The latest X-ray diffraction techniques for advanced research and development in lithium-ion battery materials by Akira Kishi
  • X-ray thin-film measurement techniques VIII: Detectors and series summary by Shintaro Kobayashi and Katsuhiko Inaba
  • Introduction to single crystal X-ray analysis 1. What is X-ray crystallography? by Kimimko Hasegawa
  • Simultaneous measurement system of thermogravimetry-differential thermal analysis and photoionization mass spectroscopy equipped with a skimmer-type interface
    TG-DTA-PIMS
    by Tadashi Arii
  • TXRF 3800e: Total reflection X-ray fluorescence spectrometer
  • PDXL 2: Advanced integrated X-ray powder diffraction suite

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Summer 2011, Volume 27, No. 2

  • Ribosome structure—A milestone of single crystal X-ray analysis by Akihito Yamano
  • X-ray thin film measurement techniques VII. Pole figure measurement by Keigo Nagao and Erina Kagami
  • Micro-area X-ray diffractometry by Keigo Nagao
  • Analysis of twinned crystals by Hiroyasu Sato and Akihito Yamano
  • Wavelength-dispersive X-ray fluorescence spectrometer ZSX PrimusIII+
  • Battery cell attachment In situ X-ray diffractometry for observations of structural change in electrode materials during charging and discharging

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Winter 2011, Volume 27, No. 1

  • X-ray thin-film measurement techniques VI. Small Angle X-ray Scattering by Aya Ogi and Katsuhiko Inaba
  • Making high speed, high resolution measurements using MiniFlex II+D/teX Ultra by Yukiko Namatame
  • Detailed observations of dynamic changes such as phase transitions, melting and crystallization using an XRD-DSC with a high-speed, high-sensitivity two-dimensional PILATUS detector by Akira Kishi
  • Technical know-how in thermal analysis measurement by Kazuko Motomura and Lani Llego Celiz
  • Bench-top X-ray diffractometer MiniFlex II+D/teX Ultra
  • Dual wavelength rotating anode system MicroMax007 VariMax DW

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Summer 2010, Volume 26, No. 2

  • X-ray thin-film measurement techniques V by Miho Yasaka
  • Ab initio crystal structure analysis based on powder diffraction data using PDXL by Akito Sasaki, Akihiro Himeda, Hisashi Konaka and Norihiro Muroyama
  • X-ray fluorescence analysis by fused bead method for ores and rocks by Yasujiro Yamada
  • Technical know-how in thermal analysis measurement: Thermal analysis under water vapor atmosphere by Yasuaki Masuda and Lani Llego Celiz
  • Powder diffraction optics for SmartLab X-ray diffractometer
  • Application Package for X-ray fluorescence analysis

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Winter 2010, Volume 26, No. 1

  • The 2009 Nobel Prize in Chemistry by Joseph D. Ferrara
  • X-ray thin-film measurement techniques IV by Shintaro Kobayashi
  • High-sensitivity micro-spot elemental analysis using a WDXRF spectrometer equipped with a polycapillary lens by Yasujiro Yamada
  • Technical know-how in thermal analysis measurement by Shinya Yamaguchi and Lani Llego Celiz
  • High resolution spiral analyzer CALSA
  • Integrated X-ray powder diffraction software PDXL
  • Integrated thin film analysis software GlobalFit (Reflectivity analysis)

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Summer 2009, Volume 25, No. 2

  • X-ray thin-film measurement techniques III - High resolution x-ray diffractometry by Takayuki Konya
  • Simultaneous measurement instrument for X-ray diffraction and differential scanning calorimetry using high-speed one-dimensional X-ray detector by Akira Kishi
  • Analysis of cement according to ASTM C114 and JIS R5204 using Supermini benchtop WDX spectrometer by Kenji Watanabe
  • Technical know-how in thermal analysis measurement by Yasuaki Masuda and Lani Llego Celiz
  • Multi-channel X-ray flouorescence spectrometer Simultix 14
  • Integrated thin film analysis software GlobalFit (Rocking Curve Analysis)

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Spring 2009, Volume 25, No. 1

  • Grazing-incidence small-angle scattering technique for nanostructure determination of surfaces and interfaces of thin films by Yoshiyasu Ito
  • X-ray thin film measurement techniques II: Out-of-plane diffraction measurements
    by Toru Mitsunaga
  • Trace heavy element analysis of wastewater and river water by X-ray fluorescence spectrometry by Takao Moriyama
  • Technical know-how in thermal analysis measurement by Yasuaki Masuda and Lani Llego Celiz
  • XtaLAB mini product overview
  • Thermo plus Evo product overview
  • CSDA (Crystallite Size Distribution Analysis software) product overview

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