Composition Identification

XRF, XRD and Raman for elemental and phase analysis

Composition IdentificationCommonly employed techniques to non-destructively determine the composition of an unknown sample are X-ray fluorescence (XRF) and X-ray diffraction (XRD). X-ray fluorescence provides elemental composition information for boron (B) through uranium (U) from parts-per-million (PPM) to percent (%) levels. Using fundamental parameters (FP) algorithms, XRF can provide quantitative analysis without the need for reference standards. X-ray diffraction provides phase composition identification and can distinguish the major, minor, and trace compounds present in a sample. XRD analysis includes the mineral name of the substance, chemical formula, crystalline system, and reference pattern number from the ICDD International database. Standardless quantitative information can also be obtained from XRD using Rietveld Analysis.

Systems

MiniFlex   MiniFlex
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
  SmartLab   SmartLab
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
  Ultima IV   Ultima IV
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
RAPID II   RAPID II
Curved imaging plate (IP) XRD system features an extremely large aperture and a choice of rotating anode or sealed tube X-ray sources
  Supermini   Supermini200
Benchtop tube below sequential WDXRF spectrometer analyzes F through U in solids, liquids and powders
  ZSX Primus   ZSX Primus
High power, tube below, sequential WDXRF spectrometer with mapping and superior light element performance
ZSX Primus II   ZSX Primus II
High power, tube above, sequential WDXRF spectrometer with mapping and superior light element performance
  ZSX       Primus IV   ZSX Primus IV
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
  Simultix 15   Simultix 15
High throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U
MFM310   MFM310
Process
XRR, XRF, and XRD metrology tool for patterned wafers; up to 300 mm wafers
  Progeny   Progeny
Handheld Raman analyzer designed to be customizable and flexible for seamless integration into any work environment