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Rigaku nano3DX is a true X-ray microscope (XRM) with ultra-wide field of view, 25X larger volume than comparable systems, and three X-ray wavelengths for different matrices.Read more...
HyPix-3000 is a next-generation two-dimensional hybrid pixel array semiconductor detector designed specifically to meet the needs of the home lab diffractionist.Read more...
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Special Feature: Pharmaceutical Analysis (5): Analysis of trace impurities in pharmaceutical products using polarized EDXRF spectrometer NEX CG.Read more...
Particle size and shape
XRD for nanomaterials
Physical and chemical properties of nanoparticles and nano crystalline materials are strongly influenced by their particle size, shape and structural strain, including rheology, surface area, cation exchange capacity, solubility, reflectivity, etc. Crystallite size is performed by measuring the broadening of a particular X-ray diffraction (XRD) peak in a diffraction pattern associated with a particular planar reflection from within the crystal unit cell. It is inversely related to the FWHM (full width at half maximum) of an individual peak: the more narrow the peak, the larger the crystallite size. This is due to the periodicity of the individual crystallite domains, in phase, reinforcing the diffraction of the X-ray beam, resulting in a tall narrow peak. If the crystals are defect free and periodically arranged, the X-ray beam is diffracted to the same angle even through multiple layers of the specimen. If the crystals are randomly arranged, or have low degrees of periodicity, the result is a broader peak.
World's most powerful θ/θ high-resolution X-ray diffractometer features an in-plane diffraction arm
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software