Rigaku Journal (ISSN 2187-9974)

Summer 2016, Volume 32, No. 2

Technical articles

  • Introduction to XRD analysis of modern functional thin films using a 2-dimensional detector — (1) GI-XRD by Shintaro Kobayashi and Katsuhiko Inaba
  • X-ray stress analysis technique using the optimization of d0 with error term / Direct Refinement Solution (DRS) method by Shoichi Yasukawa
  • Introduction to single crystal X-ray analysis X. Protein expression for X-ray structure analysis by Takashi Matsumoto
  • Liquid analysis by total reflection X-ray fluorescence spectrometer by Kazuaki Okuda
  • Sample preparation for X-ray fluorescence analysis VI. Metal samples by Takao Moriyama and Eiichi Furusawa

New Products

  • Nanoscale X-ray structural characterization instrument: NANOPIX
  • X-ray diffractometer system with single or dual PhotonJet microfocus sources: XtaLAB Synergy
  • Powder analysis softare EasyX - Qualitative and quantitative phase analyses by simple operation
  • Single crystal diffraction software: CrysAlisPro

Lecture

  • Introduction to X-ray analysis using the diffraction method by Hideo Toraya
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Winter 2016, Volume 32, No. 1

  • The 2015 Nobel Prize in Physiology or Medicine by Akihito Yamano
  • Micro-area X-ray diffraction measurement by SmartLab μHR diffractometer system with ultra-high brilliance microfocus X-ray optics and two-dimensional detector HyPix-3000 by Yuji Shiramata
  • Introduction to single crystal X-ray analysis IX. Protein structure analysis and small molecule structure analysis by Akihito Yamano
  • Sample preparation for X-ray fluorescence analysis V. Fusion bead method—part 2: practical applications by Mitsuru Watanabe
  • Advantage of handheld Raman spectrometer with 1064 nm excitation in pharmaceutical raw material identification by Taro Nogami and Fumihito Muta
  • Wavelength dispersive X-ray fluorescence spectrometer ZSX Primus IV
  • Benchtop total reflection XRF spectrometer NANOHUNTER II
  • Automated dislocation evaluation software for X-ray topography images: Topography Analysis
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Summer 2015, Volume 31, No. 2

  • Micro X-ray diffraction of cultural properties by Yurika Takumi and Masataka Maeyama
  • Introduction to single crystal X-ray analysis VIII. Key points for investigation and analysis of twins by Hiroyasu Sato
  • Sample preparation for X-ray fluorescence analysis IV. Fusion method—part 1: basic principals by Mitsuru Watanabe
  • Analysis of polymers, minerals and pharmaceuticals by TG-DTA-MS by Yoshinobu Hosoi
  • TG-DTA/Photoionization mass spectrometer: Thermo Mass Photo
  • Integrated X-ray diffraction software SmartLab Studio II
  • The creation of Rigaku Oxford Diffraction by Paul Swepston
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Winter 2015, Volume 31, No. 1

  • The Nobel prize in physics 2014 by Katsuhiko Inaba
  • Applications of the two-dimensional detector HyPix-3000 in X-ray diffractometry by Atsushi Ohbuchi
  • A primer on the use of the nano3DX high-resolution X-ray microscope by Yoshihiro Takeda and Kensaku Hamada
  • Introduction to single crystal X-ray analysis VII. Refinement of disordered structure by Kimiko Hasegawa
  • Sample preparation for X-ray fluorescence analysis III. Pressed and loose powder methods by Gakuto Takahashi
  • Portable stress analyzer SmartSite RS
  • Structure analysis program package CrystalStructure™ 4.1
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Summer 2014, Volume 30, No. 2

  • 100-Year anniversary of X-ray crystallography by Hideo Toraya
  • A current perspective of the state-of-the-art in stress analysis by Akimitsu Nezu, Hitomi Matsuzaka and Ryouichi Yokoyama
  • Elemental analysis of PM2.5 with energy dispersive X-ray fluorescence spectrometer NEX CG by Atsushi Morikawa
  • Introduction to single crystal X-ray analysis VI. About CIFs—Alerts and how to handle them by Akihito Yamano
  • Sample preparation for X-ray fluorescence analysis II. Pulverizing methods of powder samples by Atsushi Morikawa
  • Highly versatile multipurpose X-ray diffractometer: SmartLab 3
  • Single crystal diffraction systems based on hybrid pixel array technology: XtaLAB PRO series
  • Thermo plus EVO2: Thermodilatometer TDL 8411
  • High-resolution / high-speed 2D photon counting X-ray detector: HyPix-3000
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Winter 2014, Volume 30, No. 1

  • Special Feature: GaN for Opto- and Power-electronic Applications (1) General features of GaN-related materials by Katsuhiko Inaba
  • Special Feature: GaN for Opto- and Power-electronic Applications (2) Characterization of GaN-related materials using high-resolution XRD by Katsuhiko Inaba
  • Visualization and analysis of pharmaceutical solids by X-ray microscopy by Yoshihiro Takeda and Kensaku Hamada
  • Introduction to single crystal X-ray analysis V. Some Key Points of structure analysis by Rigaku's CrystalStructure by Akihito Yamano and Mikio Yamasaki
  • Sample preparation for X-ray fluorescence analysis I. Outline of sample preparation by Yasujiro Yamada
  • High-throughput, high-resolution X-ray topography imaging system: XRT micron
  • WDXRF ultra low sulfur analyzer: Micro-Z ULS
  • High-speed 1D silicon strip X-ray detector: D/teX Ultra 250
  • Plate adapter for in situ X-ray diffraction experiments: PlateMate
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Summer 2013, Volume 29, No. 2

  • Rigaku's analytical instruments for R&D and production of pharmaceutical materials by Yukiko Namatame and Yukihiro Hara
  • Drug discovery by single crystal X-ray structure analysis by Akihito Yamano
  • Evaluation of polymorphic forms by powder X-ray diffraction and thermal analysis methods by Yukiko Namatame and Hiroaki Sato
  • Pharmaceutical raw material inspection with handheld Raman spectrometer by Taro Nogami and Fumihito Muta
  • Analysis of trace impurities in pharmaceutical products using polarized EDXRF spectrometer NEX CG by Takao Moriyama
  • Introduction to single crystal X-ray analysisis IV. Data collection and processing by Akihito Yamano and Mikio Yamasaki
  • Small molecule system based on hybrid pixel array technology: XtaLAB P200
  • Micro area X-ray stress measurement system: AutoMATE II
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Winter 2013, Volume 29, No. 1

  • Crystal defects in SiC wafers and a new X-ray topography system by Kazuhiko Omote
  • Evaluation of power semiconductor device wafers by total reflection X-ray fluorescence spectrometers by Hiroshi Kohno
  • Introduction to single crystal X-ray analysis III: Obtaining quality data from a microcrystal by Akihito Yamano and Mikio Yamasaki
  • Improvements for high-pressure cell measurements using the latest single crystal laboratory systems by Hiroyasu Sato
  • X-ray fluorescence attachment for rapid in-house evaluation of heavy atom derivative crystals in protein crystallography and in-house MAD using the dual wavelength system by Takashi Matsumoto, Kimiko Hasegawa and Tomokazu Hasegawa
  • Analysis of environmental samples using an energy-dispersive X-ray fluorescence spectrometer NEX CG by Takao Moriyama
  • Curved imaging plate X-ray diffraction system DualSource RAPID II
  • Sequential benchtop WDXRF spectrometer Supermini200
  • Integrated platform SmartStudio
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Summer 2012, Volume 28, No. 2

  • Introduction to single crystal X-ray analysis II: Mounting crystals by Akihito Yamano
  • Multi-purpose X-ray diffractometer equipped with Kα₁ optical system and ab initio powder crystal structure analysis by Akimitsu Nedu
  • Size-strain analysis using the fundamental parameter (FP) method by Akihiro Himeda
  • XRF analysis by the fusion method for oxide powder on a benchtop WDXRF spectrometer Supermini by Yasujiro Yamada
  • Benchtop X-ray diffractometer | MiniFlex300 | MiniFlex600
  • Small angle X-ray scattering Kratky camera system BioSAXS-1000
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Winter 2012, Volume 28, No. 1

  • Characterization in lithium ion battery by Hikari Takahara
  • The latest X-ray diffraction techniques for advanced research and development in lithium-ion battery materials by Akira Kishi
  • X-ray thin-film measurement techniques VIII: Detectors and series summary by Shintaro Kobayashi and Katsuhiko Inaba
  • Introduction to single crystal X-ray analysis 1. What is X-ray crystallography? by Kimimko Hasegawa
  • Simultaneous measurement system of thermogravimetry-differential thermal analysis and photoionization mass spectroscopy equipped with a skimmer-type interface
    TG-DTA-PIMS
    by Tadashi Arii
  • TXRF 3800e: Total reflection X-ray fluorescence spectrometer
  • PDXL 2: Advanced integrated X-ray powder diffraction suite

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