Rigaku Journal (ISSN 2187-9974)

Spring 2008, Volume 24, No. 1

  • Mulitlayer optics for X-ray analysis by Kazuaki Shimizu and Kazuhiko Omote
  • X-ray thin-film measurement techniques by Katsuhiko Inaba
  • Structure analysis of cement and concrete materials using X-ray powder diffraction technique by Kunisha Sugimoto
  • X-ray fluorescence analysis of rocks using a benchtop X-ray fluorescence
    spectometer, Supermini
    by Kohei Kansai
  • Ultima IV product overview
  • Supermini product overview
  • D/teX Ultra product overview

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Spring 2006, Volume 23, No. 1

  • Annual Issue Of The Rigaku Journal, and Congratulation To Dr. Victor Buhrke
  • High Throughput De NovoStructure Determination on a Home Source Using Quick Soaks, Actor and
    Parameter Space Screening
    by John P. Rose, Zhi-Jie Liu, Lirong Chen, Doowon Lee, Wolfram Tempel, M. Gary Newton and Bi-Cheng Wang
  • Advances in Data Analysis of in situ X-Ray Powder Diffraction Data: A Case Study of Rubidium Oxalate (Rb₂C₂O₄) by R. E. Dinnebier, B. Hinrichsen, P. Rajiv and M. Jansen
  • Considerations Regarding the Alignment of Diffractometers for Residual Stress Analysis by Thomas R. Watkins, O. Burl Cavin, Camden R. Hubbard, Beth Matlock, and Roger D. England
  • Appendix A. Description of Goniometers and Aspects of Data Collection by Thomas R. Watkins, O. Burl Cavin, Camden R. Hubbard, Beth Matlock, and Roger D. England
  • 3D Micro X-Ray Fluorescence Analysis by Wolfgang Malzer
  • SCXmini™: Benchtop Small Molecule Single Crystal X-ray Diffraction System
  • SmartLab®Automatic X-Ray Diffractometer
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Spring 2005, Volume 22, No. 1

  • Applications of X-ray Powder Diffraction in the Pharmaceutical Industry by Gregory A. Stephenson
  • Analyzing Microstructure by Rietveld Refinement by Davor Balzar and Nicolae C. Popa
  • High Productivity Crystallography Using High-brilliance Rotating Anodes by Alexandra M. Z. Slawin and J. Derek Woollins
  • Size Distribution Analysis of Nanoparticles Using Small Angle X-ray Scattering Technique by Akito Sasaki
  • TTRAXIII with In-Plane Attachment: A versatile and sophisticated tool for the structural evaluation of thin film materials
  • X-Ray Fluorescence Spectrometer ZSX Primus II
  • Transformation and improvement of macromolecular crystal diffraction through accurately controlled humidity changes: Proteros FREE MOUNTING SYSTEM™
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Winter 2004, Volume 21, No. 2

  • Editorial Hideo Toraya (Editor-in-Chief), Ting C. Huang (Associate Editor-in-Chief)
  • Practical Aspects of SAS Structure Determination Using Chromium X-rays John P. Rose, Zhi-Jie Liu, Wolfram Temple, Lirong Chen, Doowon Lee, M. Gary Newton and Bi-Cheng Wang
  • A high-temperature diffraction study of reduction and reoxidation of nickel oxide Michael D. Dolan and Scott T. Misture
  • How Accurate Are Modern Fundamental Parameter Methods? Michael Mantler and Naoki Kawahara
  • Analytical Precision and Accuracy in X-ray Fluorescence Analysis Tomoya Arai
  • High-resolution X-ray detector for protein structural analyses: R-AXIS HR
  • Automatic X-ray single crystal structural analysis system for small molecule: R-AXIS SPIDER
  • A new two-dimensional detector for high-speed, high sensitivity, and non-destructive measurements of pharmaceutical tablets
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Volume 21 No. 1/May 2004

  • Structure Determination from Powder Diffraction Data—challenging Battery Materials by Peter Y. Zavalij and M. Stanley Whittingham
  • Recent Developments in Polymer Characterization Using X-ray Diffraction by N. Sanjeeva Murthy
  • Simultaneous Measurements of X-ray Diffraction (XRD) and Differential Scanning Calorimetry (DSC) Data Under Controlled Humidity Condition: Instrumentation and Application to Studies Hydration, Dehydration, and Rehydration Processes of Pharmaceutical Compounds by A. Kishi and H. Toraya
  • XRD and XAFS Studies of Carbon Supported Pt—Ru Electrocatalyst in a Polymer-Electrolyte-Fuel- Cell by Hisashi Yashiro and Kazuhito Hoshino
  • Evaluation of Electrolyte Membrane for PEFC in Humid Atmosphere by Using SAXS and Thermal Analysis
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Volume 20 No. 2/December 2003

  • X-ray Diffraction Patterns of Two Semiconducting Clathrates, Sr₈Ga₁₆Ge₃₀ and Cs₈Na₁₆Ge₁₃₆: Promising Candidates For Thermoelectric Applications by James A. Kaduk, Winnie Wong-Ng, and George S. Nolas
  • New Approach to Eliminate the Instrumental Aberrations From Powder X-ray Diffraction Data Based on a Fourier Method by Takashi Ida
  • Simple X-ray Dark- and Bright-field Imaging Using Achromatic Laue Optics by Masami Ando, Anton Maksimenko, Hiroshi Sugiyama, Wanwisa Pattanasiriwisawa, Kazuyuki Hyodo and Chikao Uyama
  • Microanalysis With a Polycapillary in a Vacuum Chamber by Christina Streli, Natalia Marosi, Peter Wobrauschek and Barbara Frank
  • The Simultaneous Measuring Instrument for X-ray Diffraction (XRD) and Differential Scanning Calorimetry (DSC) by P. Pianetta, A. Singh, K. Luening, S. Brennan, T. Homma, N. Kubo and M. Watanabe
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Volume 19 No. 2 & Vol. 20 No. 1/September 2003

  • Editorial - Changing of the Guards by J. Harada and T.C. Huang
  • High Throughput Crystallography on an In-house Source, using ACTOR by A.J. Sharff
  • X-ray Diffraction in Forensic Science by D.F. Rendle
  • Powder Diffraction of Modulated and Composite Structures by A.V. Mironov, A.M. Abakumov and E.V. Antipov
  • Characterization of Silicon Wafer Surfaces with SR-TXRF by P. Pianetta, A. Singh, K. Luening, S. Brennan, T. Homma, N. Kubo and M. Watanabe
  • Note from the Editorial Office
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Volume 19 No. 1/May 2002

  • Preface by C. Lecomte
  • Microfocusing Source and Multilayer Optics Based X-ray Diffraction Systems by B. Verman, L. Jiang and B. Kim
  • Influence of Crystal Structure on Molecular Structure: Syntactic Structural Chemistry by E. R. T. Tiekink
  • Debate on Some Algorithms Relating Concentration to Intensity in XRF Spectrometery by R. M. Rousseau
  • A Newly Developed High-Temperature Chamber for in situ X-ray Diffraction: Setup and Calibration Procedures by M. Dapiaggi, G. Artioli and L. Petras
  • Radial Shrinkage of Single-walled Carbon Nanotube Bundles at High Temperatures by Y. Yosida
  • Model Peak Profile functions for Powder Diffractometry as Convolutions with Instrumental Functions by T. Ida
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Volume 18 No. 2/November 2001

  • For Further Development of the Asian Crystallographic Association by Y.Ohashi
  • Using Single Wavelength Anomalous Scattering Data for In-house Protein Structure Determination by J.P. Rose, Chia-Kuei Wu, Zhi-Jie Liu, M. Gary Newton and Bi-Cheng Wang
  • Application of Multilayer Optics to X-ray Diffraction Systems by Licai Jiang, Boris Verman, Bonglea Kim, Yuri Platonov, Zaid Al-Mosheky, Rick Smith and Nick Grupido
  • Structure Determination of Molecular Crystals Directly from Powder Diffraction Data by K.D.M. Harris
  • Detection Limit and Estimate of Uncertainty of Analytical XRF Results by R.M. Rousseau
  • Development of an Open-flow Crysotat Utilizing Helium Gas for Cryogenic X-ray Diffraction Experiments by M. Nakasako, M. Sawano and M. Kawamoto
  • Direct in Situ Investigation of the Nanostructure of Molecular and Macromolecular Assemblies at Air/Water Interface by X-ray Reflectometery by H. Matsuoka, E. Mouri and K. Matsumoto
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Volume 18 No. 1/May 2001

  • Functional Algebra-an Important Bridge between Diffraction Experiments and their Evaluation by H. Bradaczek and G. Hildebrandt
  • At the Beginning of the 21st-Century by J. Harada
  • Concept of the Influence Coefficient  by R. M. Rousseau
  • Application of the Imaging Plate Methodology to the Solution of Commensurate Modulated Structures: Identification of Long-Period Mica Polytypes by X-ray Diffraction by M. Nespolo
  • Intensity Ratio of Transition-Metal Lα and Lβ Lines  by J. Kawai
  • A Convergent Beam, Parallel Detection X-ray Diffraction System for Characterizing Combinatorial Epitaxial Thin Films  by K. Omote, T. Kikuchi, J. Harada, M. Kawasaki, A. Ohtomo, M. Ohtani, T. Ohnishi, D. Komiyama and H. Koinuma
  • Study of a Structural Phase Transition in Gd5(Si1-xGex)4 by Means of Temperature Dependent X-ray Powder Diffraction by Q. L. Liu, G. H. Rao, and J. K. Liang
  • Desktop X-ray Fluorescence Spectrometer ZSXmini—High-precision analysis with a wavelength dispersive type analyzer
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