Rigaku Journal (ISSN 2187-9974)

Volume 16 No. 2/November 1999

  • Protein Crystallization and Dumb Luck by Bob Cudney
  • Metal Ions in Biological Systems by J.P. Glusker, A.K. Katz and C.W. Bock
  • Crystal Structures of Metal Aluminum Borates by J.A. Kaduk, L.C. Satek and S.T. McKenna
  • Structural Characteristics of Thin Films by X-ray Reflectivity by I. Kojima and Boquan Li
  • A Note on using R-AXIS RAPID: Rapid X-Ray Diffraction Measurement using "RAPID" IP Weissenberg Camera by H. Uekusa
  • D/max-RAPID: Fast X-ray Diffraction with Area Detector
  • Fluorescence X-ray Spectrometer System ZSX Series
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Volume 16 No. 1/May 1999

  • Preface: As chance would have it by Andre Guinier
  • Preface: Specimen preparation by V.E. Buhrke
  • Preface: High-Throughput "Combichem" Crystallography by R.C. Stevens and B.D. Santarsiero
  • The Protein Structure Project, 1950-1959: First Concerted Effort of a Protein Structure Determination in the U.S. by A. Tulinsky
  • Analysis of Limestones and Dolomites by X-ray Fluorescence by B.D. Wheeler
  • X-ray Evanescent Diffraction: Application to Metal Surfaces by M. Kimura
  • An X-ray Reflectivity Study of Surface Layering in a Magnetic Fluid by I. Takahashi, K. Ueda, Y. Tsukahara, A. Ichimiya and J. Harada
  • Atom Clusters with Icosahedral Symmetry in Cubic Alloy Phases Related to Icosahedral Quasicrystals by K. Hiraga, T.Ohsuna and K. Sugiyama
  • Determination of the Orientation of an Epitaxial Thin Film by a New Computer Program CrystalGuide by R. Yokoyama and J. Harada
  • Advanced Thin film X-ray system—Grazing incidence in-plane diffractometer ATX-G
  • Oil Content Meter using a new solvent OIL-20A
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Volume 15 No. 2/November 1998

  • Preface: A Look at the Future of Macromolecular Structure Determination by Duilio Cascio, Kenneth Goodwill and Edward Marcotte
  • Macromolecular Crystal Annealing: Techniques and Case Studies by Gerard Bunick, Joel Harp, David Timm and Leif Hanson
  • The Fundamental Algorithm: An Exhaustive Study of the Claisse-Quintin Algoritm and the Tertian and Lachance Identities Part II: Application by R.M. Rousseau
  • High Pressure Apparatus for In Situ X-ray Diffraction and Electrial Resistance Measurement at Low Temperature by Takehiko Matsumoto, Jie Tang and Nobuo Mori
  • X-ray Absorption Spectroscopy Using X-ray Fluorescence Spectrometer by Jun Kawai, Kouichi Hayashi, Kazuaki Okuda and Atsushi Nisawa
  • Amorphous Silicon (a-Si)/Crystalline Silicon (c-Si) Double HeteroJunction X-ray Sensor by Wei Guang-Pu, Wu Wen-Bion, Pei Guang-Wen, T. Kita, H. Nakayama, T. Nishino, W. Ma, H. Okamoto, M. Okuyama and Y. Hamakawa
  • X-ray Single Crystal Structure Analysis System R-AXIS RAPID
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Volume 15 No. 1/May 1998

  • A Brief History of Protein Crystallographic Computing by Duncan E. McRee
  • Recent Developments in X-ray Diffraction Analysis by Ting C. Huang
  • Why Proteins Can Be Solved By Direct Methods by M.M. Woolfson
  • The Fundamental Algorithm: A Natural Extension of the Sherman Equation Part I: Theory by Dr. Richard M. Rousseau and Dr. Jacques A. Boivin
  • Chemical Analysis of Ferrous Base Alloys Utilizing The Fundamental Parameters Technique Assisted by Standards of Similar and Dissimilar Materials by Bradner D. Wheeler
  • Tracing Mercury in the Amazon by Sadao Maruyama
  • teXsan for Windows
  • Total Reflection X-ray Fluorescence Spectrometer TXRF 300
  • X-ray Fluorescence Spectrometer for Thin Film Evaluation Wafer X 300
  • Portable X-ray Spectrometer Portarix
  • Portable High-Performance Mercury Analyzer for Field Use Mercury Sniffer/PM-2
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Volume 14 No. 2/November 1997

  • Preface: X-ray Diffraction Data Collection by Michael G. Rossmann
  • Structural Characterization of Magnetic Recording Media By Using Grazing Incident and Conventional X-ray Diffraction by Po-Wen Wang
  • The Contribution of Powder Diffraction Methods to Structural Crystallography: Rietveld and Ab-initio Techniques by Norberto Masciocchi
  • Using the X-ray Tube White Radiation Spectrum by J.R. Hester
  • Recent Theoretical Models in Grazing Incidence X-Ray Reflectometry by Krassimir Stoev and Kenji Sakurai
  • X-ray Diffraction Analysis of Self-Organized InAs Quantum Dots in MBE GaAs/InAs/GaAs (001) Sandwich Structure by Y. Zhuang, Y.T. Wang, W.Q. Ma, W.Wang, X.P. Yang, Z.Q. Chen, D.S. Jiang, H.Z. Zheng
  • Small and Wide Angle X-ray Diffractometer
  • Wafer/Disk Analyzer 3640
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Volume 14 No. 1/May 1997

  • Preface: From Single Crystals and Powders to Polycrystals: Quantitative Texture Analysis by Prof. H-R. Wenk
  • X-stream™ Cryocrystallography by John P. Rose and Bi-Cheng Wang
  • Applications of X-Rays in the Quartz-Oscillator Industry by Hans Bradaczek and Gerhard Hildebrandt
  • An X-Ray Diffraction System With Controlled Relative Humidity and Temperature by H. Hashizume, S. Shimomura, H. Yamada, T. Fujita, H. Nakazawa and O. Akutsu
  • Study of the Structures of an Asymmetrically Coupled Double-well Superlattice by Double-Crystal X-ray Diffraction by W.Q. Ma, Y. Zhuang, Y.T. Wang and D.S. Jiang
  • Desktop X-ray Diffractometer "MiniFlex+"
  • Fully Automated Sequential X-ray Spectrometer System RIX3100
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Volume 13 No. 2/November 1996

  • Preface: Microstructure Analysis by Diffraction -- The Beginning of the End by Prof. Robert L. Snyder
  • Alzheimer's Disease Amyloid beta Peptide 25-35 is Localized in the Membrane Hydrocarbon Core: X-Ray Diffraction Analysis by R. Preston Mason, Janet D. Estermyer, Jeremiah F. Kelly and Pamela E. Mason
  • X-ray Scattering From Surfaces and Interfaces and its Application to the Characterization of CaF₂/Si(111) Interfaces by J. Harada, I. Takahashi, Y. Itoh, N.S. Sokolov, N.L. Yakovlev, Y. Shusterman and J.C. Alvarez
  • Nondestructive Measurements of Stoichiometry in Undoped Semi-Insulating Gallium Arsenide by X-ray Bond Method by Nuofu Chen, Yutian Wang, Hongjia He, Zhanguo Wang, Lanying Lin and Osamu Oda
  • Quantitative Analysis of Rock Samples by an X-Ray Fluorescence Spectrometer (II) by Atsushi Goto and Yoshiyuki Tatsumi
  • 200 kV Rotating Anode Type High Energy X-ray Generator
  • Fully Automated RIX3001 X-ray Spectrometer
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Volume 13 No. 1/May 1996

  • Preface: Large synchrotron facilities in basic and applied research by Nicholas P. Samios
  • X-ray Diffraction Characterization of Multilayer Epitaxial Thin Films Deposited on (0001) Sapphire by Thomas N. Blanton and Liang-Sun Hung
  • Structural Aspects of Divergent Proton Translocation Trajectories in Carbonic Anhydrases II and V by David W. Christianson
  • In Situ X-ray Absorption Study of Copper Surface Complexes: Microbial Influenced Oxidation of Metallic Copper by Henrich H. Paradies, Michael Thies and Ulrike Hinze
  • X-ray Fluorescence Analysis of Heavy Atoms By Use of Ultrashort Wavelength X-ray by Yasuhiko Takahashi
  • An Introduction to X-ray Absorption Fine Structure (Part II) by Yasuo Udagawa
  • Ultra-high Power X-ray Generator SUPRE-X1.5A
  • High Sensitivity Total Reflection X-ray Spectrometer TXRF System 3750
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Volume 12 No. 2/November 1995

  • Preface: 100 Years of X-rays by Ulrich Hennig
  • Preface: To W.C. Röntgen 100 years later by Jenny P. Glusker
  • Microdiffraction Used to Study Domain Switching of Ferroelectric Thin Films by Michael O. Eatough, Mark A. Rodriquez, Duane Dimos and Bruce Tuttle
  • Crystal Structure of Zeolite Y as a Function of Ion Exchange by J. A. Kaduk and J. Faber
  • Utilization of the R-AXIS Area Detector in Routine Small Molecule X-ray Structure Determinations by P. J. Carroll
  • High Power X-ray Generator for XAFS Experiments by K. Sakurai and H. Sakurai
  • High-Speed X-ray Diffractometer R-AXIS IV
  • Rigaku/MiniFlex+ X-ray Diffractometer System
  • Total Reflection X-ray Spectrometer SYS 3700LE—Designed for Light Element Analysis
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Volume 12 No. 1/November 1995

  • Preface by P. K. Predecki
  • Zeolite Structure Analysis with Powder X-ray Diffraction and Solid-State NMR Techniques by G. T. Kokotailo and C. A. Fyfe
  • On the Use of Energy Dispersive X-ray Reflection to Study the Electronic Density Profile at Surfaces and Interfaces by R. Felici
  • If Your Only Single Crystal is Not Really Single by L. W. Finger
  • The 6 m Point-Focusing Small-Angle X-ray Scattering Camera at the High-Intensity X-ray Laboratory in Kyoto University and the Application to Polymer Science by S. Suehiro, H. Miyaji, Y. Miyamoto and T. Yoshizaki
  • Measurement of Thin Films on Single Crystal Substrates by the 2θ/α Scanning Methods by M. Nakayama
  • Grazing Incidence X-ray Reflectometer GXR²
  • On-Line Multichannel Simultaneous X-ray Spectrometer System Simultix 10S, Simultix 11S
  • Time Saver Mercury Analysis System RA-Mercury Analyzer with Sample-Changer
  • The 100 Year Discovery of X-rays and W. C. Röntgen's 150 Birthday
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