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Rigaku nano3DX is a true X-ray microscope (XRM) with ultra-wide field of view, 25X larger volume than comparable systems, and three X-ray wavelengths for different matrices.Read more...
HyPix-3000 is a next-generation two-dimensional hybrid pixel array semiconductor detector designed specifically to meet the needs of the home lab diffractionist.Read more...
Analytical solutions by industry
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Special Feature: Pharmaceutical Analysis (5): Analysis of trace impurities in pharmaceutical products using polarized EDXRF spectrometer NEX CG.Read more...
XRF and XRD for elemental and phase analysis
Governments and industry collectively invest billions of dollars every year into the research and development of advanced materials. This work involves study of the characteristics and uses of various substances, such as metals, ceramics, and plastics, that are employed in applications ranging from space science and defense technology to consumer products. X-ray diffraction (XRD) is a primary technique for the study advanced materials, including investigation of the following properties: identification and quantification of phases, determination of the degree of crystallinity in phases, crystallographic structure, crystal orientation and texture, residual stress analysis, thin film thickness and properties, pore sizes, as well as much more. The influence of non-ambient conditions on these properties is also routinely studied with the XRD technique. Investigations may be carried out on samples of varying types, from powders, to solid materials of varying shapes and size, to solutions and semiconductor wafers. Rigaku technology and expertise provide a number of unique solutions for materials science applications.
|ZSX Primus IV
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Benchtop tube below sequential WDXRF spectrometer analyzes F through U in solids, liquids and powders
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
New 5th-generation general purpose benchtop XRD system for phase i.d and phase quantification
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
|NEX DE VS
New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
Curved imaging plate (IP) XRD system features an extremely large aperture and a choice of rotating anode or sealed tube X-ray sources
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
|NEX QC+ QuantEZ
NEX QC+ with powerful Windows® software and optional FP.