Metals

XRD and XRF for residual stress and elemental analysis

Metals

Foundries, smelters and mills, as well as other aspects of the metals industry, are characterized by having continuous production demanding day and night control of both the process and the quality of incoming and outgoing materials. X-ray fluorescence (XRF) analysis plays a dominant role in controlling the production processes within these industries. The speed and precision of XRF makes it a preferred testing method where high throughput chemical analysis is required to support the production process. In addition to alloy stoichiometry, another important characteristic of metals is residual stress which is correlated with structural failure. X-ray diffraction (XRD) is the only accurate way to measure residual stress non-destructively. XRD offers non-contact measurements with unsurpassed spatial resolution and the ability to measure hardened materials.

Rigaku also offers a, laser-induced breakdown spectroscopy (LIBS) handheld product, the Katana. LIBS is a type of atomic emission spectroscopy which uses a highly energetic laser pulse as the excitation source. The laser is focused to form a plasma, which atomizes and excites samples that then emit characteristic spectra for the elements in the sample.

To meet the varied and demanding requirements of these analytical tasks, Rigaku offers a range of instrumentation systems that allow flexible component and sample handling while fitting every budget and need.

Systems: 
ZSX       Primus IV   ZSX Primus IV
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
  ZSX Primus   ZSX Primus
High power, tube below, sequential WDXRF spectrometer with mapping and superior light element performance
  Supermini   Supermini200
Benchtop tube below sequential WDXRF spectrometer analyzes F through U in solids, liquids and powders
Simultix 15   Simultix 15
High throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U
 
Ultima IV   Ultima IV
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
  TTRAX III   TTRAX III
World's most powerful θ/θ high-resolution X-ray diffractometer features an in-plane diffraction arm
  MiniFlex   MiniFlex
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
KT-100S   KT-100S
The latest in handheld metal analysis. designed for on-the-spot identification of the most difficult alloy grades.