Winter 2014, Volume 30, No. 1

  • Special Feature: GaN for Opto- and Power-electronic Applications (1) General features of GaN-related materials by Katsuhiko Inaba
  • Special Feature: GaN for Opto- and Power-electronic Applications (2) Characterization of GaN-related materials using high-resolution XRD by Katsuhiko Inaba
  • Visualization and analysis of pharmaceutical solids by X-ray microscopy by Yoshihiro Takeda and Kensaku Hamada
  • Introduction to single crystal X-ray analysis V. Some Key Points of structure analysis by Rigaku's CrystalStructure by Akihito Yamano and Mikio Yamasaki
  • Sample preparation for X-ray fluorescence analysis I. Outline of sample preparation by Yasujiro Yamada
  • High-throughput, high-resolution X-ray topography imaging system: XRT micron
  • WDXRF ultra low sulfur analyzer: Micro-Z ULS
  • High-speed 1D silicon strip X-ray detector: D/teX Ultra 250
  • Plate adapter for in situ X-ray diffraction experiments: PlateMate
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