Winter 2012, Volume 28, No. 1

  • Characterization in lithium ion battery by Hikari Takahara
  • The latest X-ray diffraction techniques for advanced research and development in lithium-ion battery materials by Akira Kishi
  • X-ray thin-film measurement techniques VIII: Detectors and series summary by Shintaro Kobayashi and Katsuhiko Inaba
  • Introduction to single crystal X-ray analysis 1. What is X-ray crystallography? by Kimimko Hasegawa
  • Simultaneous measurement system of thermogravimetry-differential thermal analysis and photoionization mass spectroscopy equipped with a skimmer-type interface
    TG-DTA-PIMS
    by Tadashi Arii
  • TXRF 3800e: Total reflection X-ray fluorescence spectrometer
  • PDXL 2: Advanced integrated X-ray powder diffraction suite

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