Winter 2010, Volume 26, No. 1

  • The 2009 Nobel Prize in Chemistry by Joseph D. Ferrara
  • X-ray thin-film measurement techniques IV by Shintaro Kobayashi
  • High-sensitivity micro-spot elemental analysis using a WDXRF spectrometer equipped with a polycapillary lens by Yasujiro Yamada
  • Technical know-how in thermal analysis measurement by Shinya Yamaguchi and Lani Llego Celiz
  • High resolution spiral analyzer CALSA
  • Integrated X-ray powder diffraction software PDXL
  • Integrated thin film analysis software GlobalFit (Reflectivity analysis)

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