Spring 2008, Volume 24, No. 1

  • Mulitlayer optics for X-ray analysis by Kazuaki Shimizu and Kazuhiko Omote
  • X-ray thin-film measurement techniques by Katsuhiko Inaba
  • Structure analysis of cement and concrete materials using X-ray powder diffraction technique by Kunisha Sugimoto
  • X-ray fluorescence analysis of rocks using a benchtop X-ray fluorescence
    spectometer, Supermini
    by Kohei Kansai
  • Ultima IV product overview
  • Supermini product overview
  • D/teX Ultra product overview

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