Volume 1 No. 2/December 1984

  • Preface by A. Guinier
  • Diffuse Scattering and Disorder in Crystals by H. Boysen, F. Frey and H. Jagodzinski
  • The Problem of Phase Ambiguity in Single Crystal Structure Analysis by Fan Hai-Fu
  • Thin Film X-ray Diffractometer
  • EXAFS Spectrometer with a Bent Crystal

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