Volume 3 No. 2/November 1986

  • Preface by W. Hoffman
  • The Spot Technique for Small Sample Amounts in Sequential XRF Analysis by C. Freiburg and W. Reichert
  • Study of the Mechanical Behaviour of Materials by Using Synchrotron Radiation by G. Maeder, M. Barrel, J. L. Lebrun and M. Sprauel
  • Molecular Model Building and Inspecting Using Newman Projections and Bit Mapped Graphics by H. Schenk and R. A. J. Driessen
  • Rapid Quantitative Measurement System for Retained Austenite (Multi-PSPC System)
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