Vol. 8 No.1/May 1991

  • Preface by C.N.R. Rao
  • Microbeam X-ray Diffraction and Its Applications in the Semiconductor Industry: A 15 Year Retrospective by P. W. DeHaven, C. C. Goldsmith, and T. L. Nunes
  • Applications of HAUP Method to Studies of Phase Transitions by J. Kobayashi
  • Ultra-Small-Angle X-ray Scattering by H. Matsuoka, K. Kakigami and N. Ise
  • Thin Film X-ray Diffractometry by H. Araki
  • High Temperature X-ray Diffractometer Attachment Series
  • High Precision Fully Automated Piezo Goniometer
  • High Sensitivity Type Total Reflection X-ray Spectrometer System 3726 -Wafer Surface Analysis System
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