Vol. 11 No. 2/November 1994

  • Preface by J. V Gilfrich
  • Small Molecule Diffraction Studies with the R-AXIS Area Detector -Structural Aspects of a Class of Urea Inclusion Compounds by M. E. Brown, M. D. Hollingsworth and B. D. Santarsiero
  • Residual Stress in Ion Implanted Titanium Nitride Studied by Parallel Beam Glancing Incidence X-ray Diffraction by D. E. Geist, A. J. Perry, J. R. Treglio, V. Valvoda and D. Rafaja
  • A Suggestion for Use of Ultrashort Wavelength X-rays -A Report on Development and Testing of a High-Resolution Analytical System for Electron Density Distribution by F. P. Okamura
  • Imaging of Diffraction Data by the Maximum Entropy Method -A New Approach To Crystallography by M. Sakata
  • An Introduction to X-ray Absorption Fine Structure by Y. Udagawa
  • X-ray Microdiffractometer PSPC/MDG 2000
  • High Sensitivity Total Reflection X-ray Spectrometer System 3700
  • The Apparatus Used for Measuring Mercury in the Fluorescent Lamp of the Liquid Crystal Display Mercury/TM-2
Download the articles from this issue
E-mail address:
Occasionally we would like to send you news, updates, and special promotions about our products and services. By checking the “I Agree” box and submitting your email address, you are giving us your express consent to send you these types of emails and you are also agreeing to Our Privacy Notice. (click Our Privacy Notice link to review it) and Our Terms & Conditions. (click Our Terms link to review it) I agree