Volume 14 No. 2/November 1997

  • Preface: X-ray Diffraction Data Collection by Michael G. Rossmann
  • Structural Characterization of Magnetic Recording Media By Using Grazing Incident and Conventional X-ray Diffraction by Po-Wen Wang
  • The Contribution of Powder Diffraction Methods to Structural Crystallography: Rietveld and Ab-initio Techniques by Norberto Masciocchi
  • Using the X-ray Tube White Radiation Spectrum by J.R. Hester
  • Recent Theoretical Models in Grazing Incidence X-Ray Reflectometry by Krassimir Stoev and Kenji Sakurai
  • X-ray Diffraction Analysis of Self-Organized InAs Quantum Dots in MBE GaAs/InAs/GaAs (001) Sandwich Structure by Y. Zhuang, Y.T. Wang, W.Q. Ma, W.Wang, X.P. Yang, Z.Q. Chen, D.S. Jiang, H.Z. Zheng
  • Small and Wide Angle X-ray Diffractometer
  • Wafer/Disk Analyzer 3640
Download the articles from this issue
E-mail address:
Occasionally we would like to send you news, updates, and special promotions about our products and services. By checking the “I Agree” box and submitting your email address, you are giving us your express consent to send you these types of emails and you are also agreeing to Our Privacy Notice. (click Our Privacy Notice link to review it) and Our Terms & Conditions. (click Our Terms link to review it) I agree