Volume 14 No. 2/November 1997

  • Preface: X-ray Diffraction Data Collection by Michael G. Rossmann
  • Structural Characterization of Magnetic Recording Media By Using Grazing Incident and Conventional X-ray Diffraction by Po-Wen Wang
  • The Contribution of Powder Diffraction Methods to Structural Crystallography: Rietveld and Ab-initio Techniques by Norberto Masciocchi
  • Using the X-ray Tube White Radiation Spectrum by J.R. Hester
  • Recent Theoretical Models in Grazing Incidence X-Ray Reflectometry by Krassimir Stoev and Kenji Sakurai
  • X-ray Diffraction Analysis of Self-Organized InAs Quantum Dots in MBE GaAs/InAs/GaAs (001) Sandwich Structure by Y. Zhuang, Y.T. Wang, W.Q. Ma, W.Wang, X.P. Yang, Z.Q. Chen, D.S. Jiang, H.Z. Zheng
  • Small and Wide Angle X-ray Diffractometer
  • Wafer/Disk Analyzer 3640
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