Volume 15 No. 2/November 1998

  • Preface: A Look at the Future of Macromolecular Structure Determination by Duilio Cascio, Kenneth Goodwill and Edward Marcotte
  • Macromolecular Crystal Annealing: Techniques and Case Studies by Gerard Bunick, Joel Harp, David Timm and Leif Hanson
  • The Fundamental Algorithm: An Exhaustive Study of the Claisse-Quintin Algoritm and the Tertian and Lachance Identities Part II: Application by R.M. Rousseau
  • High Pressure Apparatus for In Situ X-ray Diffraction and Electrial Resistance Measurement at Low Temperature by Takehiko Matsumoto, Jie Tang and Nobuo Mori
  • X-ray Absorption Spectroscopy Using X-ray Fluorescence Spectrometer by Jun Kawai, Kouichi Hayashi, Kazuaki Okuda and Atsushi Nisawa
  • Amorphous Silicon (a-Si)/Crystalline Silicon (c-Si) Double HeteroJunction X-ray Sensor by Wei Guang-Pu, Wu Wen-Bion, Pei Guang-Wen, T. Kita, H. Nakayama, T. Nishino, W. Ma, H. Okamoto, M. Okuyama and Y. Hamakawa
  • X-ray Single Crystal Structure Analysis System R-AXIS RAPID
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