Volume 19 No. 1/May 2002

  • Preface by C. Lecomte
  • Microfocusing Source and Multilayer Optics Based X-ray Diffraction Systems by B. Verman, L. Jiang and B. Kim
  • Influence of Crystal Structure on Molecular Structure: Syntactic Structural Chemistry by E. R. T. Tiekink
  • Debate on Some Algorithms Relating Concentration to Intensity in XRF Spectrometery by R. M. Rousseau
  • A Newly Developed High-Temperature Chamber for in situ X-ray Diffraction: Setup and Calibration Procedures by M. Dapiaggi, G. Artioli and L. Petras
  • Radial Shrinkage of Single-walled Carbon Nanotube Bundles at High Temperatures by Y. Yosida
  • Model Peak Profile functions for Powder Diffractometry as Convolutions with Instrumental Functions by T. Ida
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