Volume 20 No. 2/December 2003

  • X-ray Diffraction Patterns of Two Semiconducting Clathrates, Sr₈Ga₁₆Ge₃₀ and Cs₈Na₁₆Ge₁₃₆: Promising Candidates For Thermoelectric Applications by James A. Kaduk, Winnie Wong-Ng, and George S. Nolas
  • New Approach to Eliminate the Instrumental Aberrations From Powder X-ray Diffraction Data Based on a Fourier Method by Takashi Ida
  • Simple X-ray Dark- and Bright-field Imaging Using Achromatic Laue Optics by Masami Ando, Anton Maksimenko, Hiroshi Sugiyama, Wanwisa Pattanasiriwisawa, Kazuyuki Hyodo and Chikao Uyama
  • Microanalysis With a Polycapillary in a Vacuum Chamber by Christina Streli, Natalia Marosi, Peter Wobrauschek and Barbara Frank
  • The Simultaneous Measuring Instrument for X-ray Diffraction (XRD) and Differential Scanning Calorimetry (DSC) by P. Pianetta, A. Singh, K. Luening, S. Brennan, T. Homma, N. Kubo and M. Watanabe
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