Rigaku Features Latest Instruments at Pittcon 2015

Rigaku will be in attendance at Pittcon 2015, exhibiting its benchtop XRD, XRF spectrometers at Booth #3727

March 8, 2015 – New Orleans,LA. Rigaku Corporation is pleased to announce its attendance at the 66th annual Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy (Pittcon 2015), held March 8 - 12, 2015 at the Ernest N. Morial Convention Center, New Orleans, LA USA. Rigaku is exhibiting its benchtop lines of X-ray diffraction (XRD) and X-ray fluorescence (XRF) instrumentation at Booth # 3727.

Rigaku Corporation (The Woodlands, TX) is showing the Rigaku Supermini200 benchtop wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, the fifth generation Rigaku MiniFlex benchtop X-ray diffractometer, and the new Rigaku Micro-Z ULS WDXRF sulfur analyzer. These powerful, transportable instruments deliver speed and sensitivity through innovative technology and design. The 600 W MiniFlex is the most powerful system of its type and features an available sample changer. The Supermini200 is the only commercially available benchtop WDXRF spectrometer. The Micro-Z ULS sulfur analyzer is designed for ultra-low level sulfur analysis of diesel and petrol (gasoline) fuels.

Applied Rigaku Technologies (ART) (Austin, TX) is debuting the new NEX QC QuantEZ series of energy dispersive X-ray fluorescence (EDXRF) spectrometers, featuring the new QuantEZ analytical software, specifically designed for the series. The Windows®-based software is not only user-friendly, but sophisticated and powerful enough for the most complex analyses. The ART division is also displaying the Rigaku NEX QC+ low-cost benchtop EDXRF spectrometer and the Rigaku NEX CG Cartesian-geometry EDXRF spectrometer. The NEX QC+ is a compact elemental analyzer that delivers rapid quantitative determination of sodium (11Na) to uranium (92U) in solids, liquids, powders and alloys. Specifically designed for routine quality control applications, the NEX QC+ features an intuitive “icon-driven” touch screen interface and built-in printer for easy operation and convenience. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver outstanding repeatability and long-term reproducibility with excellent element peak resolution.

The NEX CG spectrometer is a powerful EDXRF analyzer designed to deliver rapid qualitative and quantitative determination of major and minor atomic elements across a wide variety of sample types. The Rigaku NEX OL, an advanced EDXRF process analyzer, for on-line, multi-element analysis in process liquids or for coating thickness and elemental composition in web and coil applications, will also be featured.

Dr. Claire Dentinger, Sr. Applications Scientist of Rigaku Raman Technologies, will present “Improved Material Identification Using an Advanced Handheld Raman Spectrometer” as part of the Technical Program in Session #840. The presentation will discuss the benefits of using the Rigaku Progeny, a handheld Raman analyzer with 1064nm excitation, for material analysis on Monday, March 9th at 3:45PM in Room #275.

For further information, contact:

Michael Nelson
Rigaku Global Marketing Group
tel: +1. 512-225-1796
michael.nelson@rigaku.com