Rigaku to Present Latest X-ray Solutions for Materials Analysis at AMC 2016

Rigaku is featuring its latest technologies at the Advanced Materials Characterization Workshop

May 31, 2016 – Urbana, IL. Rigaku Corporation will be participating in the upcoming Advanced Materials Characterization Workshop (AMC 2016) at the At the Frederick Seitz Materials Research Laboratory at the University of Illinois at Urbana-Champaign on June 7-8, 2016.

The workshop provides a critical, comparative and condensed overview of major analytical techniques for materials characterization with emphasis on practical applications. Presentations will cover basic and advanced topics geared towards both novice and experienced scientists.

The focus will be on problem-solving strategies, resolution requirements and potential artifacts in data collection and analysis. Several walkthrough examples from various fields will be demonstrated.

On June 7, Rigaku will be delivering the presentation, High Speed, High Resolution Nanoscale Tomography Measurements of Low Z Engineered Materials.

More information about materials science technologies from Rigaku can be found at http://www.rigaku.com/en/industry/materialsscience.

For further information, contact:

Michael Nelson
Rigaku Global Marketing Group
tel: +1. 512-225-1796
michael.nelson@rigaku.com