Rigaku analytical instrumentation to be presented at 35th International Geological Congress

Rigaku will be represented by Wirsam Scientific at 35th International Geological Congress conference to showcase its latest X-ray analytical technology

August 9, 2016 – The Woodlands, TX. Rigaku Corporation will be presenting its diverse lines of X-ray diffraction (XRD) and X-ray fluorescence (XRF) instrumentation at the 35th International Geological Congress (IGC), the premier event of the International Union of Geological Sciences (IUGS).

The South African event will be held at the Cape Town International Convention Centre from 27 August to 4 September 2016. Rigaku, a global leader in X-ray analytical instrumentation, will be represented by Wirsam Scientific, exhibiting at the conference at booth C3.

X-ray analysis techniques are routinely employed in geological research. The latest generation of wavelength dispersive XRF instrumentation enables chemical composition mapping by use of small analyzing areas and an XY-stage enabling multiple measurements of a sample. XRD is utilized to quantitatively measure phase composition. For quantitative crystalline phase determination, Rietveld analysis of X-ray diffraction data is among the most powerful methods available. Rigaku technology and expertise provide a number of unique solutions for these types of analysis.

More information about geological and mineralogical analysis solutions from Rigaku is available at http://www.rigaku.com/en/industry/geology

For further information, contact:

Michael Nelson
Rigaku Global Marketing Group
tel: +1. 512-225-1796
michael.nelson@rigaku.com