Rigaku X-Ray Analytical Instrumentation is Presented at 35th International Geological Congress

Rigaku is promoting its diverse lines of X-ray diffraction (XRD) and X-ray fluorescence (XRF) instrumentation at the 35th International Geological Congress (IGC)

August 27, 2016 – Cape Town, South Africa. Rigaku Corporation, a global leader in X-ray analytical instrumentation, is being be represented by Wirsam Scientific at 35th International Geological Congress conference to showcase its latest X-ray analytical technology. The South African event is taking place at the Cape Town International Convention Centre and will run from 27 August to 4 September 2016.

The International Geological Congress is the premier even of the International Union of Geological Sciences (IUGS). X-ray analysis techniques are routinely employed in geological research and have become more powerful with small spot excitation, mapping, and standardless quantitative analysis. X-ray fluorescence (XRF) is the key technique for characterizing the element composition of geological materials, while X-ray diffraction (XRD) is employed to quantitatively measure phase composition. Rigaku technology and expertise provide a number of unique solutions for these types of analysis and is being presented at booth C3.

Among the instruments on display at the event is the Rigaku NEX QC+ energy dispersive X-ray fluorescence (EDXRF) analyzer. The NEX QC+ is a compact elemental analyzer that delivers rapid quantitative determination of sodium (11Na) to uranium (92U) in solids, liquids, powders and alloys. Specifically designed for routine quality control applications, the new NEX QC+ features an intuitive “icon-driven” touch screen interface and built-in printer for easy operation and convenience. The 50kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver outstanding repeatability and long-term reproducibility with excellent element peak resolution.

Also being presented is the fifth generation Rigaku MiniFlex benchtop X-ray diffraction (XRD) instrument. The MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. Ideally-suited for today's fast-paced XRD analyses, the MiniFlex delivers speed and sensitivity through innovative technology enhancements such as the optional D/teX high speed detector coupled with the new higher power X-ray source as well as a state of the art graphite monochromator paired with a standard scintillation counter to maximize sensitivity by optimizing signal to noise ratios.

More information about the MiniFlex benchtop X-ray diffractometer is available at www.myminiflex.com.

Information about geological and mineralogical analysis solutions from Rigaku is available at http://www.rigaku.com/industry/geology.

For further information, contact:

Michael Nelson
Rigaku Global Marketing Group
tel: +1. 512-225-1796
michael.nelson@rigaku.com