Rigaku Presents Latest X-ray Analytical Instrumentation at 2017 AGU Fall Meeting

Rigaku will showcase its XRD, XRF and Raman technology at the 2017 AGU Fall Meeting in New Orleans

December 12, 2017 – New Oleans, LA. Rigaku Corporation will be presenting its diverse lines of X-ray diffraction (XRD), X-ray fluorescence (XRF) and Raman spectroscopy instrumentation at the 2017 American Geophysical Union Fall Meeting (AGU 2017), Tuesday, December 12, 2017 to Saturday, December 16, 2017. The event is being held at the Ernest N. Morial Convention Center in New Orleans. Rigaku, a global leader in X-ray analytical instrumentation, will be exhibiting at the event at booth #1144.

The American Geophysical Union is an international nonprofit scientific association with more than 60,000 members that works on a broad spectrum of scientific topics that span all of the Earth and space sciences. The AGU Fall Meeting is the largest worldwide conference in the geophysical sciences, attracting more than 22,000 Earth and space scientists, educators, students, and other leaders.

Analytical and industrial instrumentation from Rigaku ranges from benchtop devices, suited for researchers employing X-ray techniques, to high-end instruments with advanced analytical capabilities. Among the instruments on display at the event will be the new sixth generation Rigaku MiniFlex benchtop X-ray diffraction instrument. The MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. It is designed to deliver speed and sensitivity through innovative technology enhancements such as the HyPix-400 MF 2D hybrid pixel array detector (HPAD) coupled with an available 600 W X-ray source and new 8-position automatic sample changer.

More information about the MiniFlex benchtop X-ray diffractometer is available at www.myminiflex.com.

For further information, contact:

Michael Nelson
Rigaku Global Marketing Group
tel: +1. 512-225-1796
michael.nelson@rigaku.com