Rigaku is presenting latest X-ray analytical techniques at Norwegian X-Ray Conference

Rigaku is representing its diverse lines of lines of X-ray diffraction (XRD), X-ray fluorescence (XRF) instrumentation at the 19th Norwegian X-RAY Conference

September 5, 2016 – Fevik, Norway. Rigaku Corporation is pleased to announce its attendance at the 19th Norwegian X-RAY Conference in Fevik, Norway. The event, hosted by the Analytical Sciences division of the Norwegian Chemical Society, takes place Monday, September 5 through Wednesday, September 7, 2016.

The conference brings industrial and academic experts and users of X-ray fluorescence (XRF) and X-ray diffraction (XRD) technology in Scandinavia together with manufacturers and suppliers of analysis instruments, equipment and peripherals.

Among the exhibitions at the conference will be the “Introduction of Nanohunter II TXRF Spectrometer from Rigaku with Application Examples.” Total reflection X-ray fluorescence spectroscopy (TXRF) is a method by which an incident beam of X-rays just grazes the sample, delivering low-background noise, high-sensitivity measurement of ultra-trace elements. The Rigaku NANOHUNTER II spectrometer enables high-sensitivity ultra-trace elemental analysis, in liquids or on solid surfaces, to the parts-per-billion (ppb) level.

Applied Rigaku Technologies Inc, will also conduct a presentation on “Online X-Ray Techniques.” Process elemental analysis for liquid stream and fixed position web or coil applications can be achieved by Energy Dispersive X-Ray Fluorescence. Designed to span from heavy industrial through to food grade process gauging solutions, the Rigaku NEX OL Process Elemental Analyzer is configurable for use in both classified and non-classified areas.

For further information, contact:

Michael Nelson
Global Marketing Coordinator
Rigaku Corporation
Phone: (512) 225-1796
michael.nelson@rigaku.com