Rigaku introduces the RAPID™ II curved detector X-ray diffraction (XRD) system

Rigaku introduces the RAPID II curved detector X-ray diffraction (XRD) system

The Woodlands, TX — June 26, 2008. Rigaku Americas Corporation today announced the introduction of a new, compact, fully integrated high-resolution X-ray diffraction system, the Rigaku RAPID II. The latest member of the RAPID family of large area curved imaging plate (IP) detectors, the RAPID II combines every component needed for a high-performance X-ray diffraction system delivering no-compromise performance for applications ranging from applied crystallography to chemical crystallography. Typical applications include: high-resolution charge density measurement, micro-diffraction, diffuse scattering, measurement of weakly diffracting disordered materials, small molecule crystallography, wide angle X-ray scattering (WAXS), stress and texture measurements, as well as general purpose powder diffraction.

Central to the performance of the versatile Rigaku RAPID II is the new 2DP software that delivers the extraordinary power of project-based batch processing of two-dimensional (2D) X-ray diffraction data. This capability allows manipulation of multiple images at the same time with various analytical protocols. In addition to general 2D intensity imaging processing, the software provides for: display and automatic calculation of stress and texture data, as well as line and azimuthal integration for general purpose powder diffraction.

RAPID II is so versatile that it can replace several instruments without compromising data quality. Its unique, curved large-area detector subtends a 2θ range of 204° at a single detector setting for maximum reciprocal space coverage. Inherent to the flexibility of this system is a choice of X-ray sources, ranging from: a high-frequency 3 kW sealed tube, to a MicroMax-002+ microfocus sealed tube, to a 1.2 kW MicroMax-007 HF microfocus rotating anode generator, to an 18 kW ultra high power ultraX 18 rotating anode generator. Available optics range from a traditional graphite monochromator or high-performance SHINE optic to a VariMax confocal X-ray optic. Two goniometer configurations are available: a partial-χ arrangement for chemical crystallography and a fixed-χ system, with manual or automatic XY translation, for applied crystallography. The RAPID II includes a fully integrated CCD video camera system with zoom capabilities to image sample areas down to 1 micron. Because the Rigaku RAPID II is capable of analyzing samples as small as 10 microns, the system is ideal for the non-destructive identification of small particles (and incorporated aggregates) from a wide range of samples. In addition, XY mapping capabilities allow the measurement at precise locations of larger samples.

The RAPID II's curved IP detector has numerous advantages over other types of X-ray detectors, the most obvious being an extremely large active area, exceptionally low noise, and wide dynamic range. The large curved active area is advantageous because a massive solid angle of data is collected in a single exposure. While the wide dynamic range eliminates worrying about detector saturation, the curved-plate geometry of the RAPID II reduces oblique-incidence X-ray absorption effects seen with flat detectors of any kind.

Rigaku—Leading With Innovation

Since its inception in Japan in 1951, Rigaku has been at the forefront of analytical and industrial instrumentation technology. Rigaku and its subsidiaries form a global group focused on life sciences and general purpose analytical instrumentation. With hundreds of major innovations to their credit, Rigaku companies are world leaders in the fields of small molecule and protein crystallography, X-ray spectrometry and diffraction, X-ray optics, as well as semiconductor metrology. Rigaku employs over 1,100 people in the manufacture and support of its analytical equipment. Its products are in use in more than 70 countries—supporting research, development, and quality assurance activities. Throughout the world, Rigaku continuously promotes partnerships, dialog, and innovation within the global scientific and industrial community.

For further information, contact:

Thomas F. McNulty
Vice President, Materials Analysis SBU
Tel: 281-362-2300 x207
eMail: Thomas F. McNulty