Rigaku to promote latest X-ray analytical instrumentation at GSA 2015

Rigaku will be in attendance at Geological Society of America conference to showcase its latest XRD and XRF technology

October 28, 2015 – The Woodlands, TX. Rigaku Corporation will be presenting its diverse lines of X-ray diffraction (XRD) and X-ray fluorescence (XRF) instrumentation at GSA 2015, the Geological Society of America conference.

Rigaku, a global leader in X-ray analytical instrumentation, will be exhibiting at the conference at booth #437.

X-ray analysis techniques have been routinely employed in geological research. The latest generation of wavelength dispersive XRF instrumentation enables chemical composition mapping by use of small analyzing areas and an XY-stage enabling multiple measurements of a sample. XRD is utilized to quantitatively measure phase composition. For quantitative crystalline phase determination, Rietveld analysis of X-ray diffraction data is among the most powerful methods available. Rigaku technology and expertise provide a number of unique solutions for these types of analysis.

More information about geological and mineralogical analysis solutions from Rigaku is available at http://www.rigaku.com/en/industry/geology

For further information, contact:

Michael Nelson
Rigaku Global Marketing Group
tel: +1. 512-225-1796
michael.nelson@rigaku.com