Rigaku introduces new simultaneous WDXRF system for high-throughput analysis

Rigaku Simultix 15 is the newest version of the popular multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system.

August 8, 2017 – Tokyo, Japan. Rigaku Corporation today has introduced the newest version of their renowned multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system, the Simultix 15 high-throughput WDXRF spectrometer.

For over 40 years, the Rigaku Simultix simultaneous WDXRF spectrometer system has been a widely used elemental analytical tool for process control in industries that require high throughput and precision, such as steel and cement. The new Simultix 15 system was developed to meet changing needs and customer requirements across a range of industrial applications, offering significantly improved performance, functionality, and usability.

In contrast to the more commonplace sequential WDXRF instrumentation, where elements are measured in succession, simultaneous WDXRF expedites the measurement process by analyzing multiple fixed elemental channels concurrently. The Simultix 15 analyzer has a standard 30 fixed channel configuration that can be optionally upgraded to 40 channels. With multiple discrete and optimized elemental channels and 4 kW of X-ray tube power, the Simultix 15 spectrometer delivers exceptional analytical speed and sensitivity.

Each Simultix 15 spectrometer is customizable for specific applications with a set of discrete, optimized fixed channels for the elements of interest. All channels measure simultaneously – with no moving parts and without time delay, making simultaneous WDXRF an optimal solution in terms of time-to-result, precision, reliability, cost-per-analysis and instrument longevity.

For high-throughput applications where automation is a fundamental requirement, the Simultix 15 system can be fitted with a 48-position Automatic Sample Changer (ASC). It can also be equipped with a scanning goniometer for analysis of other elements, as well as an X-ray diffraction (XRD) channel for phase analysis, providing added flexibility.

Among the new features, unique to the Simultix 15 system, are the new “RX85” synthetic multi-layer crystal (producing approximately 30% greater intensity than existing multi-layers for Be-Kα and B-Kα), an available XRD channel for quantitative analysis by XRD, and improved software featuring a quantitative analysis flow-bar popular with users of Rigaku ZSX software.

For further information, contact:

Robert Tisdale
Global Marketing Group
Rigaku Americas Corporation
Phone: +1-512-225-1796
  Yasujiro Yamada
SBU-WDXRF
Rigaku Corporation
Phone: 81-72-693-7992
  Yurika Takumi
Office of the President
Rigaku Corporation
Phone: 81-42-545-8190