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Small angle and wide angle X-ray scattering instrument
Advanced SAXS/WAXS for nanostructure analysis
Rigaku NANOPIX SAXS/WAXS measurement system is a new X-ray scattering instrument designed for nano-structure analyses. NANOPIX can be used for both small angle scattering (SAXS) and wide angle scattering (WAXS) measurements, which makes it possible to evaluate multi-scale structures from sub-nanometer to nano-order (0.1 nm to 100 nm). It achieves the highest level of small angle resolution (Qmin to 0.02 nm-1) for a laboratory SAXS instrument.
Small angle X-ray scattering (SAXS)Small angle X-ray scattering (SAXS) is a technique used to study nano-scale structures of atoms or molecules as well as their non-uniformity by measuring the diffuse scattering from unequal electron density areas. SAXS experiments are performed in a wide range of fields from R&D to quality control.
SAXS/WAXS measurements for many applicationsNANOPIX SAXS/WAXS measurement system is applicable to a variety of materials, such as: solids, liquids, liquid-crystals, or gels (with ordered and disordered structures). Diverse applications include: nano-particle size distribution analyses, three-dimensional protein molecule structure analyses, identification of molecular assembly or disassembly, and research of advanced materials, such as carbon fiber-reinforced plastics (CFRP).
Ultra high performance SAXS/WAXS designRigaku NANOPIX SAXS/WAXS measurement system is configured with a high-brilliance, high-power point focus X-ray source, the OptiSAXS high-performance multilayer mirror, the ClearPinhole high-performance, low scattering pinhole slits, and the HyPix-3000 high-performance 2D semiconductor detector that enables detecting diffraction and scattering even from anisotropic materials. Optionally, the HyPix-6000 detector is also available for wide angle measurements, offering an expanded detection area by combining two detection modules. As one of the features, the sample-to-detector distance is changeable depending on the structure size ranging from atomic structure (micro-structures: 0.2 - 1 nm) to molecular structure (macro-structures: 1 - 100 nm).
SAXS/WAXS with broad experimental rangeNANOPIX enables measurements under various temperature or humidity conditions, experiments with simultaneous DSC (differential scanning calorimetry) measurements, as well as measurements in combination with special attachments or other external devices. Control of the measurement environment is indispensable for the research of structure-property relationships of functional materials.
|X-ray source (Microfocus rotating anode X-ray generator)|
|FR-X||MicroMax-007 HF MR|
|Brilliance||67.3 kW/mm2||31.0 kW/mm2|
|Source size||φ70 µm||φ70 µm|
|X-ray power||2.97 kW||1.2 kW|
|Voltage/Current||45 kV 66 mA||40 kV 30 mA|
|Confocal optics||Confocal Max-Flux for Cu|
2 pinhole / 3 pinhole selectable
|Sample holder and stage|
|GI-SAXS attachment||TZ, Ry and Rx axis (3 axis stage)
TZ, Ry, Rx and Φ axis (4 axis stage)
|Rapid heating and cooling temperature control attachment||Temperature control range: -150°C ~ 400°C|
|Peltier temperature control attachment||Temperature control range: -10°C ~ 120°C*|
Linkam temperature control stage series
Linkam tensile control stage series
Linkam shear control stage series
Metter hot-stage series
|Vacuum attachment||Vacuum chamber for vacuum cell|
|Multipurpose vacuum attachment||Vacuum chamber for multipurpose measurement|
|Temperature and Humidity attachment||Temperature: RT ~ 80°C, Humidity: 90% RH|
|SAXS-DSC attachment||Heat-Flux type DSC, -50°C ~ 300°C|
|Tensile attachment||Manual tensile machine|
* Temperature range of stage depends on conditions such as environmental temperature.
|Base YZ stage||Horizontal direction: ±35 mm
Vertical direction: ±25 mm
|Withstand load||< 5 kg|
|Digital telescope camera for sample (Option)|
|Detector (2D Hybrid Pixel Array Detector)|
|Sensors||Semiconductor pixel sensor|
|Active area||2984 mm2||5968 mm2|
|Number of pixels||775 x 385 pixels||775 x 770 pixels|
|Pixel size||100 μm x 100 μm|
|Global count rate||>2.9 x 1011 (1 x 106 cps/pixel)|
|Internal counter bit||Max 31-bit/pixel (Normal 16-bit/pixel)|
|Energy range||5.4 keV ~ 30 keV|
|Energy resolution||Better than 25% at CuKα|
|Readout time||3.7 ms (0 ms for zero dead time mode)|
|Detector stage||Horizontal /Vertical direction ±100 mm|
|Power||3φ AC 200 ±10% 50/60 Hz|
|Power consumption||13 A 4.5 kW|
|Grounding resistance||Earth resistance ≤ 100 Ω|
Grazing-Incidence SAXS (GI-SAXS) is a unique tool for characterizing the nanostructural features of materials at surface and interface.
In-situ SAXS and WAXS measurement is a powerful tool for investigating the dynamic behaviors of polymer morphology, phase transition during drawing.
The system performance is selectable by the target of measurement.
Differential Scanning Calorimetry (DSC)
DSC is widely used for the determination of thermodynamical states (cf. phase transition, melt/crystallization). Simultaneous measurement
Temperature and humidity
Temperature and humidity control unit is a key device for advanced functional materials in the fuel cell, etc.