Intelligent X-ray diffraction system

Powder diffraction, thin film diffraction, SAXS, in-plane scattering

SmartLab®

The SmartLab is the most novel high-resolution diffractometer available today. Perhaps its most novel feature is the SmartLab Guidance software, which provides the user with an intelligent interface that guides you through the intricacies of each experiment. It is like having an expert standing by your side.

Engineered for Performance

The system incorporates a high resolution θ/θ closed loop goniometer drive system, cross beam optics (CBO), an in-plane scattering arm, and an optional 9.0 kW rotating anode generator.

Designed for Flexibility

Coupling a computer controlled alignment system with a fully automated optical system and the Guidance software makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.

Functionality Redefined

Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the functionality to make the measurements you want to make when you want to make them.

 

Features

  • Full automated alignment under computer control.
  • Optional in-plane diffraction arm for in-plane measurements without reconfiguration.
  • Focusing and parallel beam geometries without reconfiguration.
  • SAXS capabilities.

SmartLab specifications

Sealed tube generator Maximum rated output 3 kW
Rated tube voltage - current 20 - 60 kV; 2 - 60 mA
Stability Within ±0.005% for 10% input power variation
Target Cu (others: optional)
Focus size 0.4 x 12 mm line/point (others: optional)
Radiation enclosure Full safety shielding with failsafe open/close mechanism
Rotating anode generator Maximum rated output 9 kW
Rated tube voltage - current 20 - 45 kV; 10 - 200 mA
Stability Within ±0.005% for 10% input power variation
Target Cu (others: optional)
Focus size 0.4 x 8 mm line/point
Radiation enclosure Full safety shielding with fail safe open/close mechanism
Goniometer Scanning mode θs/θd coupled or θs, θd independent optical encoder controlled
Goniometer radius 300 mm
Minimum step size 0.0001°
Eulerian cradle χ: -5 to 95°/0.001° step
φ: -720 to 720°/0.002° step
Ζ: -4 to 1 mm/0.0005 mm step
Optional X, Y stages: 20 mm/0.0005 mm step, 100 mmφ/0.0005 mm step, 150 mmφ/0.0005 mm step
Optional Rx, Ry stage: -5 to 5°/0.002° step
Sample size Max. 200 mmφ x 6 mm thick (24 mm thick, optional)
Optics Incidence optics CBO, Ge 2-bounce and 4-bounce monochromators, automatic variable divergence slit
Receiving optics Automatic variable scattering slit PSA, Ge 2-bounce analyzer, automatic variable receiving slit
Detector Scintillation counter Scintillator NaI, photomultiplier with preamplifier

 

Description
HyPix-3000 Hybrid Pixel Array Detector

2D semiconductor detector with large active area (approx. 3000 mm²), small pixel size (100 μm²), ultra-high dynamic range, high sensitivity, and XRF suppression by high and low energy discrimination. Seamless switching from 2D-TDI (Time Delay and Integration) mode to 2D snapshot mode to 1D-TDI mode to 0D mode with a single detector.

D/teX Ultra 250

The D/tex Ultra 250 is a 1D silicon strip detector that decreases data acquisition time by almost 50% compared to competitive detectors. This is achieved by increasing the active area of the aperture and thus increasing the count rate. Compared to the previous model, the D/teX Ultra, has a smaller pixel pitch (0.075mm) and is longer in the direction of 2θ. For researchers who are interested in the lowest XRF suppression possible, the combination of an optional receiving monochromator and low-enrgy discrimination offer outstanding suppression.

The D/teX Ultra 250 is designed for the SmartLab diffractometer, Rigaku's most innovative diffraction product.

D/tex Ultra HE

The D/teX Ultra HE is a special silicon strip detector that is optimized for high energy X-ray work by utilizing a thicker detector material. For Cr, Fe, Co, and Cu, the efficiency is approximately 99%. With Mo radiation the efficiency is approximately 70%.

Mapping Stage

Allows xy positioning of the sample in the X-ray beam. 20 mm, 50 mm, and 75 mm translations available.

RxRy Tilt Stage

Allows xy positioning of the sample in the X-ray beam. 20 mm, 50 mm, and 75 mm translations available.

Secondary Monochromator

The optional secondary monochromator can be used with the D/teX Ultra 250 silicon strip detector for outstanding energy resolution. If the D/teX Ultra 250 is used in conjunction with the secondary monochromator an energy resolution of 320 eV is achieved, or 4% with CuKα.

Anton Paar DCS 350 Domed Cooling Stage

Sample cooling and heating stage with spherical X-ray window for in-situ texture and thin film analysis. Compact and light-weight stage with liquid nitrogen sample cooling.
Temperature range: -100 °C to 350 °C
Atmospheres: air, inert gas, vacuum(10⁻¹ mbar)

Anton Paar DHS 1100 Domed Hot Stage

Sample heating stage with spherical X-ray window for in-situ texture and thin film analysis. Compact and light-weight stage with air-cooling.
Temperature range: 25 °C to 1100°C
Atmospheres: air, inert gas, vacuum(10⁻¹ mbar)

Anton Paar HTK 1200N High-Temperature Oven Chamber

High-temperature heating stage for powders and polycrystalline solid samples. Heating to 1200 °C in air and vacuum possible.

Main features:

  • furnace heater for good temperature uniformity
  • sample spinning for good data quality
  • capillary option for transmission XRD
  • easy sample loading

Temperature range: 25 °C to 1200 °C
Atmospheres: air, inert gas, vacuum(10⁻⁴ mbar)

Anton Paar HTK 16N High-Temperature Chamber

High-temperature sample heating stage with strip heater for powder diffraction. Allows for very fast heating and cooling and ensures high sample position stability with heating strip pre-stressing.

Temperature range:

with Pt-strip: 25 °C to 1600 °C in air, vacuum
with Ta and C-strip: 25 °C to 1500 °C in vacuum

Atmospheres: air, inert gas, vacuum(10⁻⁴ mbar)

Anton Paar HTK 2000N High-Temperature Chamber

High-temperature sample heating stage with strip heater for powder XRD of refractory materials. The use of a tungsten strip offers extremely high temperature and fast heating and cooling, the strip pre-stressing mechanism ensures high sample position stability.

Temperature range:

with W-strip: 25 °C to 2300 °C in vacuum
with Pt -strip: 25 °C to 1600 °C in air, vacuum

Atmospheres: vacuum(10⁻⁴ mbar), inert gas, air

Anton Paar TTK 450 Low Temperature Chamber

Sample cooling and heating stage with liquid nitrogen cooling. Large temperature range and ease of use for a wide range of applications. With beam knife and optional zero background sample holder for investigation of organic materials at low 2θ angles.

Temperature range: -193 °C to 450 °C
Atmospheres: air, inert gas, vacuum(10⁻² mbar)

SmartLab Studion: A central software platform that simplifies X-ray analysis

SmartLab Studio is a platform that seamlessly integrates the software modules that operate and analyze data generated by the SmartLab diffractometer. It enhances the communication between the application software modules and increases ease of use. For example, data generated from one application module can be sent to another with a single mouse click using the Launcher, an interface that serves as the starting point for application software modules. When you select a data file, it will show you what applications can be launched. Various processes from measurement to analysis are automatically executed by using a recipe function. Using SmartLab Studio as the central point of all data measurement and analysis allows for a more efficient workflow and fewer possibilities for errors.

The Guidance package, based on built-in expertise, suggests the optimal hardware confi guration and settings for specific application measurements. The program will determine which optics are most appropriate for a given application, determine the instrument settings and execute the measurement, off ering a completely automated measurement sequence. Since the SmartLab has built-in component recognition, Guidance will not only tell you how you should confi gure the SmartLab for a given measurement, it will also warn you if you have not confi gured it properly. Expert advice coupled with hardware that will confirm the correct configuration is the foundation of the SmartLab system.

Rigaku’s PDXL is a modular full-functioned powder X-ray analysis software package developed to combine extreme ease of use with powerful state of the art analysis methods. The unique flowbar makes this package the easiest to use in the industry.

2DP is a program for processing two dimensional (2D) data. Functions include conversion to 1D data, background subtraction and merging while maintaining data in a 2D format, and the creation of actual movies depicting the changes in scattering data resulting from dynamical processes. Videos can be saved in AVI or WMV formats.

3D Explore is used to display reciprocal space maps (for crystalline evaluation of single crystal thin films or structure evaluation of epitaxial films), as well as pole figures (for surface orientation evaluation of single crystal thin films or preferred orientation evaluation of multi-crystal thin films). Along with topography display and control of color mapping, equivalent-intensity surfaces and contours displays are supported. The measured data can be overlapped with simulation data exported from the DSS module (Diffraction Space Simulation, i.e. reciprocal space map simulation) of SmartLab Guidance. In addition, smoothing, background subtraction, peak search and other data processing functions are also available.

Data Mapper is a powerful tool to display the results of an XY mapping measurement performed using the SmartLab. Virtually any material property measured as a function of position on a sample can be mapped and displayed for simple visualization of anisotropic properties.

The GlobalFit program offers advanced parallel tempering base fitting methods that have been customized for analytical X-ray applications. Years of practical experience in the development of experimental methods for the X-ray analysis of thin films have been incorporated into the GlobalFit programs to complement and enhance the performance of traditional parallel tempering algorithms. As with all Rigaku software products, GlobalFit programs offer an intuitive, user friendly interface. Automatic reporting, macro driven operation, and Rigaku’s trademark flowbar interface combine to offer users exceptional ease of use and productivity.

Based on small angle scattering data, size distribution of particles and pores existing in media such as powders, bulk material, thin films, and liquids can be analyzed. Generally, a size of about 1 - 100 nm can be analyzed with data collected using standard SAXS, but NANO-Solver can also process length scales up to 1000 nm using USAXS data. Particles and pores of various shapes—such as spheres, core shells, cylinders, and spheroids—can be routinely analyzed. Additionally, a Debye model for analyzing indefinite shapes is also included.

Intensity corrections (e.g. subtracting Compton scattering intensity) of the X-ray scattering pattern allows for determination of the RDF (Radial Distribution Functions) and PDF (Pair Distribution Functions) by the Fourier transform method. Rigaku’s PDF analysis software module can also refine RDFs and PDFs using the MEM (Maximum Entropy Method). This feature allows patterns with small ghost peaks to be obtained even from data with low spatial resolution, which often occurs when scattering is measured using Cu or Mo X-ray sources.

Testimonials


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