Evaluation of the crystal structure of a DVD recording layer

Using Rigaku's SmartLab multipurpose diffractometer to measure in-plane diffraction, the crystal structure, lattice constants and crystallite size of a polycrystalline thin film can be found. Nitrogen is added to a recoding layer (GeSbTe 20 nm) employed in various recording media, such as DVD, and the changes in crystallite size, lattice distortion and lattice constants are measured. The measurement results are shown below.


Residual Stress

As shown in the figure and table above, with this method, the change of crystallinity and its structure can be evaluated in detail using the actual media. The crystallite sizes agree well with the results determined by TEM observations.


The SmartLab is the most novel high-resolution diffractometer available today. Perhaps its most novel feature is the SmartLab Guidance software, which provides the user with an intelligent interface that guides you through the intricacies of each experiment. It is like having an expert standing by your side. Read more...

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