Grazing incident X-ray diffraction (GIXRD) and X-ray reflectivity (XRR) studies of a Ni-Mn-Ga material

Ni-Mn-Ga materials are attracting increasing interest due to their large magnetic-field-induced stresses and the potential applications in sensors and actuators.

A combination of GIXRD (Figure 1) and XRR (Figure 2) analysis was performed on the Rigaku's Ultima IV multipurpose diffraction system on one such material. Such a combined investigation not only reveals the composition and texture for this Ni-Mn-Ga film but also provides useful information about layer thickness, density and roughness. This information is then used to tune these materials.

Figure 1

Figure 2

Ultima IVThe Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku's patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different Read more about Rigaku's Ultima IV...

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