Particle size distribution of Cu nanoparticles in polyimide film

In the past, for metal or ceramics nanoparticles dispersed in a film, the average particle size and distribution were estimated from cross-sectional transmission electron microscope (TEM) images, which required enormous labor and time.

Small angle X-ray scattering (SAXS) measurements can be made in tens of minutes using a sample of about 15 mm × 2 mm, with no need to slice or pre-treat the film.

The figures below show the temperatures of heat treatment and cross-sectional TEM photos of samples in which copper nanoparticles were dispersed in the polyimide film.

temperatures of heat treatment

cross-sectional TEM photos of samples

The graphs below show the SAXS data (top) and the the results of analysis with NANO-Solver (bottom); the average particle sizes were determined to be 3.9 nm and 8.8 nm.

SAXS data

cross-sectional TEM photos of samples

Samples supplied by Professor Hidemi Nawafune and Instructor Kensuke Akamatsu, Faculty of Science and Engineering, Konan University.

The Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku's patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different Read more...

Ask for more info