Small area mapping of a fracture on a TiN material

The ability to perform XRD scans on a very small sample area is a useful tool for many applications.

The two figures below show one such analysis of the fracture line of a TiN rod using the small area attachment on the Ultima IV diffractometer. In order to investigate material property changes along and perpendicular to the fracture line a series of scans can be made.

analysis of the fracture line of a TiN rod
investigate material property changes
Figure 1
Figure 2

The next two figures show the XRD scans performed in these regions using the parallel beam geometry and creating controlled, very small (less than 1x1 mm) spot sizes by using a specially designed selection slit. Various XRD patterns obtained from the two studies were then compared to analyze the phase content, crystallite size (grain boundary), amorphous content and preferred orientation of the material along and perpendicular to the fracture line.

analysis of the fracture line of a TiN rod
Figure 3



investigate material property changes
Figure 4



The Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku's patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different measurements...fast. Read more...

Ask for more info