Small angle X-ray scattering of nanomaterials

Figure 1 shows a Small Angle X-ray Scattering (SAXS) profile of a (C3H6)n - α -polypropylene based nanomaterial collected on the Ultima IV. This class of nanomaterials has various applications, including utilization in high strength fibers for lightweight composites and as flame-retardant materials.

Small Angle X-ray Scattering (SAXS) profile
Figure 1

The observed profile can be reconstructed as a convolution of the scattering profile from a nanostructural model and the instrument function of the X-ray system (blue curve in Figure 2).

a convolution of the scattering profile
Figure 2

TA non-linear least square fit onto the raw data of the calculated profile from the structural model using Rigaku's NANO-Solver software provides information about the size distribution and shape of the particles/pores, as summarized below.

information about the size distribution and shape of the particles/pores
Figure 3



Ultima IVThe Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku's patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different measurements...fast. Read more about Rigaku's Ultima IV...

Ask for more info