Rietveld refinement for a cement sample

The figure below shows the results of a Rietveld refinement for a cement sample using powder diffraction data collected on an Ultima IV multipurpose diffraction system at 298 K.

Rietveld refinement for a cement sample

X-ray diffraction analysis of cements for quality control and research and development poses a significant challenge, as there are a large number of phases associated with each type of cement. These phases result in a substantial peak overlap.

The Rietveld refinement method represents a viable technique to address these issues and obtain a reasonable quantitative result for each of the phases present.

Calculated (orange), experimental (black), and difference (pink) profiles are shown along with phases present and quantitative analysis results.

The Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku's patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different measurements...fast. Read more...

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