NANOHUNTER II: palladium catalyst analysis

effluent

With a traditional direct excitation XRF spectrometer, it is difficult to obtain high signal-to-noise spectra for elements like palladium (Pd) or rhodium (Rh) due to high background intensities in the K-line energy range (20 -22 keV). However, with the TXRF technique, it is possible to dramatically reduce the background present in the measured spectra. In this example, the calibration curve was calculated from measurements on samples made by pipetting 10 μL of 5 ppm and 10 ppm respective aqueous Pd standards onto glass substrates followed by drying. A lower limit of detection (LLD) of 2 ppb was obtained from this curve.